Electrical wind force-driven and dislocation-templated amorphization in phase-change nanowires

Science

Volumn 336, Issue 6088, 2012, Pages 1561-1566

  Nam, Sung Wook ^a   Chung, Hee Suk ^a   Lo, Yu Chieh ^a,b   Qi, Liang ^a,b   Li, Ju ^a,b   Lu, Ye ^c   Johnson, A T Charlie ^a,c   Jung, Yeonwoong ^a   Nukala, Pavan ^a   Agarwal, Ritesh ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOWIRE;

AMORPHOUS MEDIUM; CRYSTALLIZATION; DISLOCATION; IN SITU MEASUREMENT; MEMORY; NANOTECHNOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; CRYSTAL STRUCTURE; ELECTRIC RESISTANCE; ELECTRICITY; ELECTRON; ELECTRON DIFFRACTION; MORPHOGENESIS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84862612951     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1220119     Document Type: Article

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