First data from a commercial local electrode atom probe (LEAP)

Microscopy and Microanalysis

Volumn 10, Issue 3, 2004, Pages 373-383

  Kelly, Thomas F ^a   Gribb, Tye T ^a   Olson, Jesse D ^a   Martens, Richard L ^a   Shepard, Jeffrey D ^a   Wiener, Scott A ^a   Kunicki, Thomas C ^a   Ulfig, Robert M ^a   Lenz, Daniel R ^a   Strennen, Eric M ^a   Oltman, Edward ^a   Bunton, Joseph H ^a   Strait, David R ^a  

^a Imago Scientific Instruments   (United States)

Author keywords

3D imaging; Atom probe; LEAP; Local electrode atom probe; Microanalysis; Nanoscale analysis

Indexed keywords

ALLOY; ALUMINUM; CHROMIUM; COBALT; IRON; NICKEL;

CHEMISTRY; CONFERENCE PAPER; ELECTRON PROBE MICROANALYSIS; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; SEMICONDUCTOR;

ALLOYS; ALUMINUM; CHROMIUM; COBALT; ELECTRON PROBE MICROANALYSIS; IRON; NANOTECHNOLOGY; NICKEL; SEMICONDUCTORS;

EID: 3042585904     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040565     Document Type: Conference Paper

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