STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials

Ultramicroscopy

Volumn 125, Issue , 2013, Pages 112-129

  Grillo, Vincenzo ^a,b   Rossi, Francesca ^b  

^a CNR   (Italy)

^b IMEM CNR   (Italy)

Author keywords

Geometric phase analysis; Quantitative electron microscopy; STEM HAADF

Indexed keywords

ALIASING EFFECTS; ANALYSIS ALGORITHMS; ATOMIC SCALE; BACKGROUND SUBTRACTION; GEOMETRIC PHASE ANALYSIS; GRAPHIC INTERFACES; LARGE REGIONS; QUANTITATIVE ELECTRON MICROSCOPY; STATE-OF-THE-ART APPROACH; STEM-HAADF; UNDER SAMPLED;

COMPUTER SOFTWARE; CRYSTALLINE MATERIALS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY;

STEM CELLS;

AMPLITUDE MODULATOR; ARTICLE; ATOM; CALIBRATION; COMPUTER PROGRAM; COMPUTER SIMULATION; CONTROLLED STUDY; CRYSTALLINE SUBSTANCE; ELECTRON MICROSCOPY; FILTRATION; GEOMETRY; IMAGE ANALYSIS; LEARNING ALGORITHM; MATERIALS; MATHEMATICAL ANALYSIS; NONLINEAR SYSTEM; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 84873149378     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.10.009     Document Type: Article

References (68)

1. Coene W.M.J., Thust A, Op de Beeck M., van Dyck D. Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy 1996, 64:109.
2. Haigh S.J., Sawada H., Takayanagi K., Kirkland A.I. Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted illumination and exit-wave restoration. Microscopy and Microanalysis 2010, 16:409.
3. Hytch M, Snoeck E., Kilaas R. Quantitative measurement of displacement and strain fields from HREM micrographs 74. Ultramicroscopy 1998, 131.
4. Rosenauer A., Kaiser S., Reisinger T., Zweck J., Gebhardt W., Gerthsen D. Optik 1996, 102:63.
5. Rosenauer A., Remmele T., Gerthsen D., Tillmann K., Förster A. Atomic scale strain measurements by the digital analysis of high-resolution transmission electronmicroscopic lattice images. Optik 1997, 105:99.
6. Grillo V., Albrecht M., Remmele T., Strunk H.P., Egorov A.Y., Riechert H Simultaneous experimental evaluation of In and N concentrations in InGaAsN quantum wells. Journal of Applied Physics 2001, 90:3792.
7. McGibbon A.J, Pennycook S.J., Jesson D.E. Crystal structure retrieval by maximum entropy analysis of atomic resolution incoherent images. Journal of Microscopy 1999, 195:44.
8. Verbeeck J., Bertoni G. Ultramicroscopy. Deconvolution of core electron energy loss spectra 2009, 109:1343.
9. Dunin-Borkowski R.E., Midgley P.A. Electron tomography and holography in materials science. Nature Materials 2009, 8:271.
10. V. Grillo, E. Rotunno, STEM_CELL: a software tool for electron microscopy. Part I Simulations, , in press. http://dx.doi.org/10.1016/j.ultramic.2012.10.016.
11. Grillo V., Carlino E., Glas F. Influence of the static atomic displacement on atomic resolution Z-contrast imaging. Physical Review B 2008, 77:054103.
12. Ercolani D., Rossi F., Li A., Roddaro S., Grillo V., Salviati G., Beltram F., Sorba L. InAs/InSb nanowire heterostructures grown by chemical beam epitaxy. Nanotechnology 2009, 20:505605.
13. Heun S., Biasiol G., Grillo V., Carlino E., Sorba L., Golinelli G.B., Locatelli A., Mentes T.O., Guo F.Z. Journal of Nanoscience and Nanotechnology 2007, 7:1721.
14. Biasiol G., Heun S., Golinelli G.B., Locatelli A., Mentes T.O., Guo F.Z., Hofer C., Teichert C., Sorba L. Morphology and composition of InAs/GaAs quantum dots. Applied Physics Letters 2005, 87:223106.
15. Carlino E., Grillo V. Atomic-resolution quantitative composition analysis using scanning transmission electron microscopy Z-contrast experiments. Physical Review B 2005, 71:235303.
16. Grillo V. The effect of surface strain relaxation on HAADF imaging. Ultramicrosocopy 2009, 109:1453.
17. Rosenauer A., Mehrtens T., Mueller K., Gries K., Schowalter M., et al. Composition mapping in InGaN by scanning transmission electron microscopy. Ultramicroscopy 2011, 111:1316-1327.
18. Grillo V. An advanced study of the response of ADF detector. Journal of Physics: Conference Series 2011, 326:012036.
19. LeBeau J.M., Stemmer S. Experimental quantification of annular dark-field images in scanning transmission electron microscopy. Ultramicroscopy 2008, 108:1653.
20. Yu Z., Batson P.E., Silcox J. Artifacts in aberration-corrected ADF-STEM imaging. Ultramicroscopy 2003, 96:275.
21. Teukolsky S.A., Vetterling W.T., Flannery B.P., Press W.H. Numerical recipies in C 1992, Cambrige University Press, Cambridge. second edition.
22. Dweyer C. Simulation of scanning transmission electron microscope images on desktop computers. Ultramicroscopy 2010, 110:195.
23. Xu X., Beckman S.P., Specht P., Weber E.R., Chrzan D.C., Erni R.P., Arslan I., Browning N., Bleloch A., Kisielowski C. Distortion and Segregation in a Dislocation Core Region at Atomic Resolution. Physical Review Letter 2005, 95:145501.
24. Xin Y., Pennycook S.J., Browning N.D., Nellist P.D., Sivananthan S., Omnès F., Beaumont B., Faurie J.P., Gibart P. Direct observation of the core structures of threading dislocations in GaN. Applied Physics Letters 1998, 72:2680.
25. Grillo V. Advances in STEM-CELL. A Free Software for TEM and STEM analysis and simulations. Probe deconvolution in STEM-HAADF Microscopy and Microanalysis 2011, 17(suppl. S2):1292.
26. Watanabe K., Kotaka Y., Nakanishic N., Yamazakic T., Hashimoto I., Shiojiri M. Deconvolution processing of HAADF STEM images. Ultramicroscopy 2002, 92:191.
27. Hollis J.M., Dorband J.R, Yusef-Zahed F. Comparing restored HST and VLA imagery of R Aquarii. Astrophysical Journal 1992, 386:293.
28. Richardson W.H. Bayesian-Based Iterative Method of Image Restoration. Journal of the Optical Society of America 1972, 62:55.
29. Sawada H., Sannomiya T., Hosokawa F., Nakamichi T., Kaneyama T., Tomita T., Kondo Y., Tanaka T., Oshima Y., Tanishiro Y., Takayanagi K. Measurement method of aberration from Ronchigram by autocorrelation function. Ultramicroscopy 2008, 108:1467.
30. Lupini A.R., Wang P., Nellist P.D., Kirkland A.I., Pennycook S.J. Aberration measurement using the Ronchigram contrast transfer function. Ultramicroscopy 2010, 110:891.
31. Velázquez-Muriel J.A., Sorzano C.O.S., Fernández J.J., Carazo J.M. A method for estimating the CTF in electron microscopy based on ARMA models and parameter adjustment. Ultramicroscopy 2003, 96:17.
32. Baik H.S., Epicier T., Van Cappellen E. Quantitative analysis of HRTEM images from amorphous materials. I: about the estimation of Cs and f from HRTEM diffractogram. European Physical Journal AP 1998, 4:11.
33. Carragher B., Potter C.S., Kriegman D.J., Mallick S.P. Ultramicroscopy 2005, 104:8.
34. Thust A., Barthel J. Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns. Ultramicroscopy 2010, 111:27.
35. Vulović M., Franken E., Ravelli R.B.G., van Vliet L.J., Rieger B. Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy. Ultramicroscopy 2012, 116:115.
36. http://www.hremresearch.com/.
37. C. Koch. http://www.christophtkoch.com/stem/index.html.
38. Saxton W.O. Transform noise statistics and Fourier component estimation. Scanning Microscopy 1997, 11:257.
39. Hytch M.J., Plamann T. Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopy. Ultramicroscopy 2001, 87:199-212.
40. Hytch M. Analysis of variations in structure from high resolution electron microscope images by combining real space and fourier space information. Microscopy Microanalysis Microstructures 1997, 8:41.
41. Gontard L.C., Ozkaya D., Dunin-Borkowski R.E A simple algorithm for measuring particle size distributions on an uneven background from TEM images. Ultramicroscopy 2011, 111:101.
42. Arevalillo Herráez M., Burton D.R., Lalor M.J., Gdeisat M.A. A Fast two-dimensional phase unwrapping algorithm based on sorting by reliability following a non-continuous path. Applied Optics 2002, 41:7437.
43. http://www.ljmu.ac.uk/GERI/.
44. 2 nanocrystals. Journal of the American Chemical Society 2008, 130:11223.
45. Rueckert D., Aljabar P., Heckemann R.A., Hajnal J.V. Diffeomorphic registration using B-splines. Medical Image Computing and Computer Assisted Intervention 2006, 9:702.
46. Hytch M., Houdellier F., Hue F., Snoeck E. Nanoscale holographic interferometry for strain measurements in electronic devices. Nature 2008, 453:1086.
47. Koch C.T., Burak Özdöl V., van Aken P.A. An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices. Applied Physics Letters 2010, 96:091901.
48. Su D., Zhu Y. Scanning moiré fringe imaging by scanning transmission electron microscopy. Ultramicroscopy 2010, 110:229-233.
49. Sanchez A.M., Galindo P.L., Kret S., Falke M. An approach to the systematic distortion correction in aberration-corrected HAADF images. Journal of Microscopy 2006, 221:1.
50. Sanchez A.M., Galindo P.L., Kret S., Falke M., Beanland R. Quantitative strain mapping applied to aberration-corrected HAADF images. Microscopy and Microanalysis 2006, 12:285.
51. Galindo P.L., Kret S., Sanchez A.M., Laval J.Y., Yanez A., Pizarro J., Guerrero E., Ben T., Molina S. The peak Pairs algorithm for strain mapping from HRTEM images. Ultramicroscopy 2007, 107:1186.
52. Anderson S.C., Birkeland C.R., Anstis G.R., Cockayne D.J.H. An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging. Ultramicroscopy 1997, 69:83.
53. Rosenauer A., Fischer U., Gerthsen D., Förster A. Composition evaluation by lattice fringe analysis. Ultramicroscopy 1998, 72:121.
54. Molina S.I., Sales D.L., Galindo P.L., Fuster D., González Y., Alén B., González L., Varela M., Pennycook S.J. Column-by-column compositional mapping by Z-contrast imaging. Ultramicroscopy 2009, 109:172.
55. Klenov D.O., Stemmer S. Contributions to the contrast in experimental high-angle annular dark-field images. Ultramicroscopy 2006, 106:889.
56. Walther T., Humphreys C. Quantification of the composition of silicon germanium/silicon structures by high-angle annular dark field imaging. Proceedings of IOP Electron Microscopy and Analysis Group Conference Series 1997, 153:303.
57. Grillo V., Mueller K., Volz K., Glas F, Grieb T., Rosenauer A. Strain, composition and disorder in ADF imaging of Semiconductors. Journal of Physics Conference Series 2011, 326:012006.
58. V. Grillo, E. Carlino, L. Felisari, L. Manna, L. Carbone, Z-contrast STEM 3D information by Abel transform in rotational symmetric systems, In: A. Cullis (Ed.), Proceedings of Microscopy of Semiconducting Materials, 2007.
59. Wang P., Bleloch A.L., Falke M., Goodhew P.J., Ng J., Missous M. Direct measurement of composition of buried quantum dots using aberration-corrected scanning transmission electron microscopy. Applied Physics Letters 2006, 89:072111.
60. Abel H. Journal Für Die Reine und Angewandte Mathematik 1826, 1:153.
61. Deutsch M., Beniaminy I. Derivative-free inversion of Abel's integral equation. Applied Physics Letters 1992, 41:27.
62. Tomassini P., Giulietti A. A generalization of Abel Inversion to non axisymmetric density distribution. Optics Communications 2001, 199:143.
63. Kret S., Ruterana P., Rosenauer A., Gerthsen D. Extracting quantitative information from high resolution electron microscopy. Physica Status Solidi B 2001, 227:247.
64. Heun S., Biasiol G. Compositional mapping of semiconductor quantum dots and rings. Physics Reports 2011, 117:500.
65. Carlino E., Grillo V. A novel method for focus assessment in atomic resolution STEM. Ultramicroscopy 2006, 106:603.
66. 1-xN/GaN using high-angle annular dark field images. Ultramicroscopy 2009, 109:1171.
67. 3 spherical domain. Journal of the American Chemical Society 2006, 128:16953.
68. Lichte H., Formanek, P., Lenk A., Linck M., Matzeck C., Lehmann M., Simon P. Electron holography: applications to materials questions. Annual Review of Materials Research 2007, 37:539.