Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted illumination and exit-wave restoration

Microscopy and Microanalysis

Volumn 16, Issue 4, 2010, Pages 409-415

  Haigh, Sarah J ^a   Sawada, Hidetaka ^b   Takayanagi, Kunio ^c,d   Kirkland, Angus I ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b JEOL LTD   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

aberration correction; aperture synthesis; electron microscopy; exit wave reconstruction; high resolution

Indexed keywords

EID: 77957220647     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927610093359     Document Type: Conference Paper

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