Scanning moiré fringe imaging by scanning transmission electron microscopy

Ultramicroscopy

Volumn 110, Issue 3, 2010, Pages 229-233

  Su, Dong ^a   Zhu, Yimei ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Interference imaging; Moir fringes; STEM

Indexed keywords

ATOMIC IMAGING; ATOMIC LATTICE; BEAM DAMAGE; CARBON CONTAMINATION; CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPIES; DARK FIELD IMAGING; IMAGE DEGRADATION; INTERFERENCE IMAGING; LATTICE DISCONTINUITIES; MISFIT DISLOCATIONS; SCANNING GRATING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPATIAL INTERFERENCE; STRAIN FIELDS;

ATOMS; BURGERS VECTOR; ELECTRON BEAMS; EPITAXIAL FILMS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

SCANNING;

CARBON;

ARTICLE; CONTROLLED STUDY; CRYSTAL STRUCTURE; ELECTRON BEAM; GRATING; IMAGE PROCESSING; IMAGE QUALITY; INFORMATION RETRIEVAL; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL PROCESSING;

EID: 75849139838     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.11.015     Document Type: Article

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