Simultaneous experimental evaluation of In and N concentrations in InGaAsN quantum wells

Journal of Applied Physics

Volumn 90, Issue 8, 2001, Pages 3792-3798

  Grillo, V ^a,c   Albrecht, M ^a   Remmele, T ^a   Strunk, H P ^a   Egorov, A Yu ^b,d   Riechert, H ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b INFINEON TECHNOLOGIES AG   (Germany)

^c CNR   (Italy)

^d IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035886146     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1402139     Document Type: Article

References (26)

1. M. Weyers, M. Sato, and H. Ando. Jpn. J. Appl. Phys., Part 1 31, 853 (1992).
2. M. Kondow, S. I. Nakatsuka, T. Kitatani, Y. Yazawa, and M. Okai, Jpn. J. Appl. Phys., Part 1 35, 5711 (1996).
3. M. C. Larson, M. Kondow, T. Kitatani, K. Nakahara, K. Tamura, H. Inoue, and K. Uomi, IEEE Photonics Technol. Lett. 10, 188 (1998).
4. H. Riechert, A. Yu. Egorov, B. Borchet, and S. Illek, Compound Semicond. 6, 71 (2000).
5. S. Sato and S. Satoh, Electron. Lett. 35, 1251 (1999).
6. F. Hohnsdorf, J. Koch, S. Leu, W. Stolz, B. Borchet, and M. Druminski, Electron. Lett. 35, 571 (1999).
7. D. E. Mars, D. I. Babic, Y. Kaneko, Y.-I. Chang, S. Subramanya, J. Krüger, P. Perlin, and E. R. Weber, J. Vac. Sci. Technol. B 17, 1272 (1999).
8. H. P. Xin, K. L. Kavanagh, Z. Q. Zhu, and C. W. Tu, J. Vac. Sci. Technol. B 17, 1649 (1999).
9. D. Schlenker, T. Miyamoto, Z. Pan, F. Koyama, and K. Iga, J. Cryst. Growth 196, 67 (1999).
10. J. Neugebuuer and C. G. Van deWalle, Phys. Rev. B 51, 10568 (1995).
11. G. B. Stringfellow, J. Electrochem. Soc. 119, 1780 (1972).
12. A. Rosenauer, S. Kaiser, T. Raisinger, J. Zweck, and W. Gebhardt, Optik (Stuttgart) 102, 63 (1996).
13. M. J. Hÿtch, E. Snoeck, and R. Kilaas, Ultramicroscopy 74, 131 (1999).
14. R. Bierwolf, M. Hohenstein, F. Phillipp, O. Brandt, G. E. Crook, and K. Ploog, Ultramicroscopy 49, 273 (1993).
15. P. Kightley, C. J. Kiely, and P. Goodhew, Inst. Phys. Conf. Ser. 117, 595 (1991).
16. A. Rosenauer, U. Fischer, D. Gerthsen, and A. Förster, Ultramicroscopy 72, 121 (1998).
17. A. Ourmazd, P. Schwander, C. Kisielowski, M. Seibt, F. H. Baumann, and Y. O. Kim, Inst. Phys. Conf. Ser. 134, 1 (1993).
18. C. Kisielowski, P. Schwander, F. H. Baumann, M. Seibt, Y. Kim, and A. Ourmazd, Ultramicroscopy 58, 131 (1995).
19. A. Yu. Egorov, D. Bernklau, D. Livshits, V. Ustinov, Zh. I. Alferov, and H. Riechert, Inst. Phys. Conf. Ser. 166, 359 (2000).
20. M. M. J. Treacy, J. M. Gibson, and A. Howie, Philos. Mag. A 51, 389 (1985).
21. P. Stadelmann, Ultramicroscopy 51, 389 (1985).
22. J. M. Moison, C. Guille, F. Houzay, F. Barthe, and M. Van Rompay, Phys. Rev. B 40, 6149 (1989).
23. C. Frigeri, A. Di Paola, N. Gambacorti, D. M. Ritchie, F. Longo, and M. Della Giovanna, J. Mater. Sci. Eng. B 28, 346 (1994).
24. S. P. Ahrenkiel, A. G. Norman, M. M. Al-Jassim, A. Mascarenhas, S. R. Lee, D. M. Follstaedt, E. D. Jones, J. Mirecki-Millunchick. and R. D. Twesten, J. Appl. Phys. 84, 6088 (1998).
25. L. De Caro, A. Giuffrida, E. Carlino, and L. Tapfer, Acta Crystallogr., Sect. A: Found. Crystallogr. A53, 168 (1997).
26. A. Rosenauer, T. Reisinger, E. Steinkirchner, J. Zweck, and W. Gebhardt, J. Cryst. Growth 152, 42 (1995).