Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns

Ultramicroscopy

Volumn 111, Issue 1, 2010, Pages 27-46

  Barthel, J ^a   Thust, A ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Aberrations; Diffractogram; HRTEM; Optical stability; Pattern recognition; Thon rings

Indexed keywords

ABERRATION MEASUREMENT; ACCEPTANCE TESTS; CHARACTERISATION; DEFOCUS; DIFFRACTOGRAM; DIFFRACTOGRAMS; HARDWARE AND SOFTWARE; HRTEM; IMAGING PROPERTIES; MEASUREMENT PRECISION; NUMERICAL PROCEDURES; OPTICAL STABILITY; PATTERN RECOGNITION PROBLEMS; QUANTITATIVE STABILITY; THON RINGS;

NUMERICAL ANALYSIS; PATTERN RECOGNITION;

STABILITY CRITERIA;

ACCURACY; ARTICLE; AUTOMATED PATTERN RECOGNITION; DIFFRACTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HUMAN; IMAGE ANALYSIS; IMAGE QUALITY; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; QUALITY CONTROL; QUANTITATIVE ANALYSIS; SIGNAL NOISE RATIO; SYSTEMATIC ERROR; TRANSMISSION ELECTRON MICROSCOPY; VALIDATION PROCESS; VELOCITY;

EID: 78149268899     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.09.007     Document Type: Article

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