An approach to the systematic distortion correction in aberration-corrected HAADF images

Journal of Microscopy

Volumn 221, Issue 1, 2006, Pages 1-7

  Sanchez, A M ^a,b   Galindo, P L ^a   Kret, S ^c   Falke, M ^d   Beanland, R ^e   Goodhew, P J ^b  

^a UNIVERSITY OF CÁDIZ   (Spain)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

^c INSTITUTE OF PHYSICS   (Poland)

^d SUPERSTEM LABORATORY   (United Kingdom)

^e Bookham Technology   (United Kingdom)

Author keywords

Algorithm; Distortion; HAADF; Nanostructures; STEM

Indexed keywords

GALLIUM ARSENIDE;

ABERRATION-CORRECTED; DISTORTIONS CORRECTIONS; ELECTRICAL INTERFERENCE; GAAS SUBSTRATES; HIGH-ANGLE ANNULAR DARK FIELDS; HIGH-ANGLE ANNULAR DARK-FIELD IMAGES; MAPPING TECHNIQUES; STEM; STRAIN MAPPING; STRAIN-FREE;

III-V SEMICONDUCTORS;

GALLIUM ARSENIDE;

ACCURACY; ALGORITHM; ARTICLE; ARTIFACT; CRYSTAL; ELECTROMAGNETIC FIELD; FOURIER ANALYSIS; HYSTERESIS; MATHEMATICAL MODEL; NANOPARTICLE; PRIORITY JOURNAL; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 33645226591     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01533.x     Document Type: Article

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