Analysis of variations in structure from high resolution electron microscope images by combining real space and fourier space information

Microscopy Microanalysis Microstructures

Volumn 8, Issue 1, 1997, Pages 41-57

  Hytch, Martin J ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002714755     PISSN: 11542799     EISSN: None     Source Type: Journal    
DOI: 10.1051/mmm:1997105     Document Type: Article

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