Direct measurement of composition of buried quantum dots using aberration-corrected scanning transmission electron microscopy

Applied Physics Letters

Volumn 89, Issue 7, 2006, Pages

  Wang, P ^a,b   Bleloch, A L ^a,b   Falke, M ^a,b   Goodhew, P J ^a,b   Ng, J ^c   Missous, M ^c  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b SUPERSTEM LABORATORY   (United Kingdom)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTRON ENERGY LOSS SPECTROSCOPY; OPTICAL RESOLVING POWER; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION; ATOMIC RESOLUTION; COMPOSITION MEASUREMENT; DARK FIELD IMAGES;

SEMICONDUCTOR QUANTUM DOTS;

EID: 33747508566     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2335361     Document Type: Article

References (15)

1. L. G. Wang, P. Kratzer, N. Moll, and M. Scheffler, Phys. Rev. B 62, 1897 (2000).
2. N. Liu, J. Tersoff, O. Baklenov, A. L. Holmes, and C. K. Shih, Phys. Rev. Lett. 84, 334 (2000).
3. G. B. Gustavo, A. Narvaez, and Alex Zunger, J. Appl. Phys. 98, 043708 (2005).
4. M. Bissiri, G. B. H. von Hogersthal, M. Capizzi, P. Frigeri, and S. Franchi, Phys. Rev. B 64, 245337 (2001).
5. A. G. Cullis, D. J. Norris, M. A. Migliorato, and M. Hopkinson, Appl. Surf. Sci. 244, 65 (2005).
6. M. A. Migliorato, A. G. Cullis, M. Fearn, and J. H. Jefferson, Phys. Rev. B 65, 115316 (2002).
7. J. P. McCaffrey, S. Fafard, Z. R. Wasilewski, L. D. Madsen, M. D. Robertson, and E. M. Griswold, J. Appl. Phys. 88, 2272 (2000).
8. R. Beanland, Ultramicroscopy 102, 115 (2005).
9. P. F. Fewster, V. Holy, and D. Zhi, J. Phys. D 36, A217 (2003).
10. P. A. Crozier, M. Catalano, and R. Cingolani, Ultramicroscopy 94, 1 (2003).
11. C. M. Tey, H. Y. Liu, A. G. Cullis, I. M. Ross, and M. Hopkinson, J. Cryst. Growth 285, 17 (2005).
12. Kazunari Ozasa, Yoshinobu Aoyagi, Masaya Iwaki, and Hiroki Kurata, J. Appl. Phys. 94, 313 (2003).
13. S. J. Pennycook and D. E. Jesson, Ultramicroscopy 37, 14 (1991).
14. R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1996).
15. E. C. Cosgriff, M. P. Oxley, L. J. Allen, and S. J. Pennycook, Ultramicroscopy 102, 317 (2005).