Strain, composition and disorder in ADF imaging of semiconductors

Journal of Physics: Conference Series

Volumn 326, Issue 1, 2011, Pages

  Grillo, V ^a,b   Mueller, K ^c   Volz, K ^d   Glas, F ^e   Grieb, T ^c   Rosenauer, A ^c  

^a CNR   (Italy)

^b IMEM CNR   (Italy)

^c UNIVERSITY OF BREMEN   (Germany)

^d PHILIPPS UNIVERSITY MARBURG   (Germany)

^e CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

PHYSICS;

ADF IMAGING; CONTRAST MECHANISM; DETECTION ANGLE; EFFECT OF STRAIN; IMAGE INTERPRETATION; INGAASN; INGAP/GAAS; N CONTENT;

CHEMICAL ANALYSIS;

EID: 82955251164     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/326/1/012006     Document Type: Conference Paper

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