Digital analysis of high resolution transmission electron microscopy lattice images

Optik (Jena)

Volumn 102, Issue 2, 1996, Pages 63-69

  Rosenauer, A ^a   Kaiser, S ^a   Reisinger, T ^a   Zweck, J ^a   Gebhardt, W ^a   Gerthsen, D ^b  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COMPUTER SOFTWARE; CRYSTAL LATTICES; ERROR ANALYSIS; HETEROJUNCTIONS; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; TRANSMISSION ELECTRON MICROSCOPY; UNIX;

DISPLACEMENT; ERROR ESTIMATION; ION MILLING; LATTICE DISTANCES; LATTICE IMAGES; LATTICE SITE DETECTION; NOISE REDUCTION;

IMAGE ANALYSIS;

EID: 0030124869     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

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