Electron holography: Applications to materials questions

Annual Review of Materials Research

Volumn 37, Issue , 2007, Pages 539-588

  Lichte, Hannes ^a   Formanek, Petr ^a   Lenk, Andreas ^a   Linck, Martin ^a   Matzeck, Christopher ^a   Lehmann, Michael ^b   Simon, Paul ^c  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^c MAX PLANCK INSTITUTE FOR CHEMICAL PHYSICS OF SOLIDS   (Germany)

Author keywords

Atomic resolution; Electric fields; Electron phase; Magnetic fields; Phase measurements; Wave optics

Indexed keywords

FERROELECTRIC MATERIALS; FERROMAGNETIC MATERIALS; NANOSTRUCTURED MATERIALS; PHASE MEASUREMENT; STRUCTURAL PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; ELECTRON PHASE; OBJECT-MODULATED ELECTRON WAVE; WAVE OPTICS;

ELECTRON HOLOGRAPHY;

EID: 34848867188     PISSN: 15317331     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev.matsci.37.052506.084232     Document Type: Review

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