A novel method for focus assessment in atomic resolution STEM HAADF experiments

Ultramicroscopy

Volumn 106, Issue 7, 2006, Pages 603-613

  Grillo, V ^a   Carlino, E ^a  

^a LABORATORIO TASC   (Italy)

Author keywords

Atomic resolution HAADF; Focus assessment; STEM

Indexed keywords

ATOMIC BEAMS; FOURIER TRANSFORMS; LIGHTING; PHOTODETECTORS; THICKNESS MEASUREMENT;

ATOMIC RESOLUTION HAADF; DARK FIELD DETECTORS; FOCUS ASSESSMENT; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

TRANSMISSION ELECTRON MICROSCOPY;

ALGORITHM; ANTENNA; ARTICLE; FOURIER ANALYSIS; HIGH ANGLE ANNULAR DARK DETECTOR; ILLUMINATION; MATHEMATICAL ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; VALIDITY;

EID: 33747237330     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.03.005     Document Type: Article

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