Composition mapping in InGaN by scanning transmission electron microscopy

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1316-1327

  Rosenauer, Andreas ^a   Mehrtens, Thorsten ^a   Müller, Knut ^a   Gries, Katharina ^a   Schowalter, Marco ^a   Venkata Satyam, Parlapalli ^a   Bley, Stephanie ^a   Tessarek, Christian ^a   Hommel, Detlef ^a   Sebald, Katrin ^a   Seyfried, Moritz ^a   Gutowski, Jürgen ^a   Avramescu, Adrian ^b   Engl, Karl ^b   Lutgen, Stephan ^b  

^a UNIVERSITY OF BREMEN   (Germany)

^b OSRAM OPTO SEMICONDUCTORS GMBH   (Germany)

Author keywords

Composition determination; Frozen lattice simulation; Multislice simulation; Quantitative STEM

Indexed keywords

ANALYSIS METHOD; ATOMIC DISPLACEMENT; BEAM CONVERGENCE; CHEMICAL MAPPING; COMPOSITION DETERMINATION; CONCENTRATION PROFILES; COVALENT RADII; ELECTRON BEAM IRRADIATION; ENERGY DISPERSIVE X-RAY; ENERGY-FILTERED IMAGING; GEOMETRICAL MODELS; HIGH-ANGLE ANNULAR DARK FIELDS; IMAGE SIMULATIONS; INCIDENT ELECTRON BEAMS; LATTICE APPROXIMATIONS; LATTICE SIMULATION; LATTICE-PLANE BENDING; MICROPHOTOLUMINESCENCE SPECTROSCOPY; MULTI SLICES; QUANTITATIVE STEM; QUANTUM DOT EMISSION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNIFICANT IMPACTS; STEM IMAGES; STILLINGER-WEBER POTENTIALS; STRAIN STATE;

COMPUTER SIMULATION; ELECTRON BEAMS; ELECTRONS; GALLIUM NITRIDE; INDIUM; LIGHT POLARIZATION;

TRANSMISSION ELECTRON MICROSCOPY;

GALLIUM; INDIUM; NITROGEN; QUANTUM DOT;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; CONCENTRATION (PARAMETERS); CONTROLLED STUDY; COVALENT BOND; ELASTICITY; ELECTRON BEAM; ENERGY DISPERSIVE X RAY ANALYSIS; ENERGY FILTERED IMAGING; ILLUMINATION; IMAGING; INTERMETHOD COMPARISON; IRRADIATION; MICROPHOTOLUMINESCENCE SPECTROCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION; SPECTROSCOPY; STRAIN STATE ANALYSIS; THICKNESS;

EID: 80051813705     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.04.009     Document Type: Article

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