Aberration measurement using the Ronchigram contrast transfer function

Ultramicroscopy

Volumn 110, Issue 7, 2010, Pages 891-898

  Lupini, A R ^a   Wang, P ^b   Nellist, P D ^b   Kirkland, A I ^b   Pennycook, S J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Aberration correction; Aberration measurement; Contrast transfer function; Inline hologram; Ronchigram; STEM; TEM

Indexed keywords

ABERRATION CORRECTION; ABERRATION MEASUREMENT; CONTRAST TRANSFER FUNCTION; IN-LINE; INLINE HOLOGRAM; RONCHIGRAMS; TEM;

ABERRATIONS; AMORPHOUS FILMS; HOLOGRAMS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

TRANSFER FUNCTIONS;

ARTICLE; AUTOMATION; IMAGE ANALYSIS; IMAGE ENHANCEMENT; IMAGE PROCESSING; MATHEMATICAL MODEL; OPTICAL RESOLUTION; PROCESS DESIGN; PROCESS OPTIMIZATION; RONCHIGRAM ANALYSIS; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77953537667     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.04.006     Document Type: Article

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