Artifacts in aberration-corrected ADF-STEM imaging

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 275-284

  Yu, Zhiheng ^a   Batson, Philip E ^b   Silcox, John ^c  

^a Cornell University   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c Department of Obstetrics Gynecology   (United States)

Author keywords

Annular dark field (ADF); Artifact; Black level; Power spectrum; Scanning transmission electron microscopy (STEM); Sub probe

Indexed keywords

COMPUTER SIMULATION; PROBES; TRANSMISSION ELECTRON MICROSCOPY;

ARTIFACTS;

IMAGING TECHNIQUES;

ARTIFACT; CONFERENCE PAPER; ELECTRON MICROSCOPE; ELECTRON PROBE MICROANALYSIS; IMAGE ANALYSIS; IMAGING SYSTEM; PARTICLE SIZE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION; SPECTROSCOPY;

EID: 0037488187     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00093-7     Document Type: Conference Paper

References (29)

1. Krivanek O.L., Dellby N., Lupini A.R. Ultramicroscopy. 78:1999;1.
2. Dellby N., Krivanek O.L., Nellist P.D., Batson P.E., Lupini A.R. J. Electron Microsc. 50:2001;177.
3. Crewe A.V., Wall J., Langmore J. Science. 168:1970;1338.
4. Zeitler E., Thomson M.G.R. Optik. 31:1970;258 Zeitler E., Thomson M.G.R. Optik. 31:1970;359.
5. Zeitler E., Thomson M.G.R. Optik. 31:1970;258 Zeitler E., Thomson M.G.R. Optik. 31:1970;359.
6. Batson P.E., Krivanek O.L., Dellby N. Nature. 418:2002;617.
7. Scherzer O. J. Appl. Phys. 20:1949;20.
8. E.J. Kirkland, Advanced Computing in Electron Microscopy, Plenum, New York, 1998.
9. Cowley J.M., Moodie A.F. Acta Cryst. 10:1957;609.
10. Goodman P., Moodie A.F. Acta Cryst. A. 30:1974;280.
11. Ishizuka K., Uyeda N. Acta Cryst. A. 33:1977;740.
12. Self P.G., O'Keefe M.A., Buseck P.R., Spargo A.E.C. Ultramicroscopy. 11:1983;35.
13. Kirkland E.J., Loane R.F., Silcox J. Ultramicroscopy. 23:1987;77.
14. Loane R.F., Kirkland E.J., Silcox J. Acta Cryst. A44:1988;912.
15. Ishizuka K. Ultramicroscopy. 90:2002;71.
16. Loane R.F., Xu P., Silcox J. Acta Cryst. A47:1991;267.
17. Muller D.A., Edward B., Kirkland E.J., Silcox J. Ultramicroscopy. 86:2001;371.
18. Loane R.F., Xu P., Silcox J. Ultramicroscopy. 40:1992;121.
19. Hillyard S., Loane R.F., Silcox J. Ultramicroscopy. 49:1993;14.
20. Hillyard S., Silcox J. Ultramicroscopy. 52:1993;325.
21. Yamazaki T., Kawasaki M., Watanabe K., Hashimoto I., Shiojiri M. J. Electron Microsc. 50:2001;517.
22. J.W. Tukey, An introduction to the calculations of numerical spectrum analysis, in: B. Harris (Ed.), Spectral Analysis of Time Series, Wiley, New York, 1967, p. 25.
23. D.F. Elliott, K.R. Rao, Fast Transforms: Algorithms, Analyses, Applications, Academic Press, New York, 1982, p. 222.
24. Shin D.H., Kirkland E.J., Silcox J. Appl. Phys. Lett. 55:1989;2456.
25. Xu P., Kirkland E.J., Silcox J., Keyse R. Ultramicroscopy. 32:1990;93.
26. Hammel M., Colliex C., May C., Kohl H., Rose H. Ultramicroscopy. 34:1990;257.
27. Silcox J., Xu P., Loane R.F. Ultramicroscopy. 47:1992;173.
28. Spence J.C.H., Cowley J.M. Optik. 50:1978;129.
29. Nellist P.D., Pennycook S.J. Adv. Imag. Electron Phys. 113:2000;147.