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Volumn 71, Issue 23, 2005, Pages

Atomic-resolution quantitative composition analysis using scanning transmission electron microscopy Z-contrast experiments

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[No Author keywords available]

Indexed keywords


EID: 28344447572     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.235303     Document Type: Article
Times cited : (64)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.