An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging

Ultramicroscopy

Volumn 69, Issue 2, 1997, Pages 83-103

  Anderson, S C ^c   Birkeland, C R ^a   Anstis, G R ^b   Cockayne, D J H ^c  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^c NONE

Author keywords

Scanning transmission electron microscopy (STEM)

Indexed keywords

ALGORITHMS; COMPOSITION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION COMPOSITIONAL MAPPING; MULTISLICE CODE; THERMAL DIFFUSE SCATTERING;

HETEROJUNCTIONS;

METAL; ORGANIC COMPOUND;

ALGORITHM; ARTICLE; CALCULATION; DARKNESS; LIGHT SCATTERING; MICROSCOPE IMAGE; QUANTITATIVE ASSAY; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; ULTRASTRUCTURE;

EID: 0031238872     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00041-7     Document Type: Article

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