A method for estimating the CTF in electron microscopy based on ARMA models and parameter adjustment

Ultramicroscopy

Volumn 96, Issue 1, 2003, Pages 17-35

  Velazquez Muriel J A ^a   Sorzano, C O S ^a   Fernandez J J ^b   Carazo, J M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b UNIVERSITY OF ALMERÍA   (Spain)

Author keywords

ARMA models; CTF estimation; Electron microscopy; Image processing; Spectral estimation

Indexed keywords

COMPUTER SOFTWARE; IMAGE ANALYSIS; REGRESSION ANALYSIS; TRANSFER FUNCTIONS;

CONTRAST TRANSFER FUNCTION (CTF);

ELECTRON MICROSCOPY;

ACCURACY; ALGORITHM; ANALYTIC METHOD; ARTICLE; ELECTRON MICROSCOPY; EVALUATION; FOURIER TRANSFORMATION; IMAGE ANALYSIS; IMAGE DISPLAY; MATHEMATICAL COMPUTING; PARAMETRIC TEST; PROCESS MODEL; THEORETICAL MODEL;

ALGORITHMS; CRYOELECTRON MICROSCOPY; FOURIER ANALYSIS; IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, ELECTRON; MODELS, STATISTICAL; SOFTWARE;

ARMA; ZEROS;

EID: 0345701398     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00377-7     Document Type: Article

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