SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 92, Issue 3-4, 2002, Pages 191-199

Deconvolution processing of HAADF STEM images

(6) Watanabe, K a Kotaka, Y b Nakanishi, N c Yamazaki, T c Hashimoto, I c Shiojiri, M d,e

a TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY (Japan)

b FUJITSU LABORATORIES LTD (Japan)

c TOKYO UNIVERSITY OF SCIENCE (Japan)

d KANAZAWA MEDICAL UNIVERSITY (Japan)

e KYOTO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Atomic resolution microscopy; Deconvolution; HAADF STEM; Maximum entropy method

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ENTROPY; SCANNING;

DUMBBELLS;

TRANSMISSION ELECTRON MICROSCOPY;

SILICON;

ARTICLE; ATOM; ATOMIC RESOLUTION MICROSCOPY; CONTROLLED STUDY; DECONVOLUTION; ENTROPY; HIGH ANGLE DARK FIELD; IMAGE PROCESSING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TECHNIQUE;

EID: 0036295098 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(02)00132-8 Document Type: Article

Times cited : (43)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.