Extracting quantitative information from high resolution electron microscopy

Physica Status Solidi (B) Basic Research

Volumn 227, Issue 1, 2001, Pages 247-295

  Kret, S ^a,c   Ruterana, P ^a   Rosenauer, A ^b   Gerthsen, D ^b  

^a LABORATOIRE CRISMAT   (France)

^b UNIVERSITY OF KARLSRUHE   (Germany)

^c INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035539598     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200109)227:1<247::AID-PSSB247>3.0.CO;2-F     Document Type: Article

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