Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images

Optik (Jena)

Volumn 105, Issue 3, 1997, Pages 99-107

  Rosenauer, A ^a   Remmele, T ^a   Gerthsen, D ^a   Tillmann, K ^b   Forster A ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CRYSTAL LATTICES; DIGITAL SIGNAL PROCESSING; ELECTRON BEAMS; ERROR ANALYSIS; HETEROJUNCTIONS; IMAGE ANALYSIS; STRAIN MEASUREMENT;

DIGITAL ANALYSIS OF LATTICE IMAGES (DALI);

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031146722     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

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