-
3
-
-
0036603885
-
Mechanical characterization of Sn-Ag-based lead-free solders
-
DOI 10.1016/S0026-2714(02)00017-3, PII S0026271402000173
-
Amagai, M., Watanabe, M., Omiya, M., Kishimoto, K. and Shibuya, T. (2002), "Mechanical characterization of Sn-Ag-based lead-free solders", Microelectronics Reliability, Vol. 42 No. 6, pp. 951-66. (Pubitemid 34551888)
-
(2002)
Microelectronics Reliability
, vol.42
, Issue.6
, pp. 951-966
-
-
Amagai, M.1
Watanabe, M.2
Omiya, M.3
Kishimoto, K.4
Shibuya, T.5
-
4
-
-
0030141874
-
Effect of PCB finish on the reliability and wettability of ball grid array packages
-
PII S1070989496017112
-
Bradley, E. and Banerji, K. (1996), "Effect of PCB finish on the reliability and wettability of ball grid array packages", IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, Vol. 19 No. 2, pp. 320-30. (Pubitemid 126797788)
-
(1996)
IEEE Transactions on Components Packaging and Manufacturing Technology Part B
, vol.19
, Issue.2
, pp. 320-330
-
-
Bradley, E.1
Banerji, K.2
-
5
-
-
51349150879
-
Effect of silver content and nickel dopant on mechanical properties of Sn-Agbased solders
-
Che, F., Luan, J.E. and Baraton, X. (2008), "Effect of silver content and nickel dopant on mechanical properties of Sn-Agbased solders", The Proceedings of the 58th Electronic Components Technology Conference, Orlando, FL, May 27-30, pp. 485-90.
-
(2008)
The Proceedings of the 58th Electronic Components Technology Conference, Orlando, FL, May 27-30
, pp. 485-490
-
-
Che, F.1
Luan, J.E.2
Baraton, X.3
-
6
-
-
77956619074
-
The study of mechanical properties of Sn-Ag-Cu lead-free solders with different Ag contents and Ni doping under different strain rates and temperatures
-
Che, F.X., Zhu, W.H., Poh, E.S.W., Zhang, X.W. and Zhang, X.R. (2010), "The study of mechanical properties of Sn-Ag-Cu lead-free solders with different Ag contents and Ni doping under different strain rates and temperatures", Journal of Alloys and Compounds, Vol. 507 No. 1, pp. 215-24.
-
(2010)
Journal of Alloys and Compounds
, vol.507
, Issue.1
, pp. 215-224
-
-
Che, F.X.1
Zhu, W.H.2
Poh, E.S.W.3
Zhang, X.W.4
Zhang, X.R.5
-
10
-
-
33845700856
-
Issues related to the implementation of Pb-free electronic solders in consumer electronics
-
DOI 10.1007/s10854-006-9021-7
-
Frear, D. (2007), "Issues related to the implementation of Pb-free electronic solders in consumer electronics", Journal of Materials Science: Materials in Electronics, Vol. 18, pp. 319-30. (Pubitemid 44963694)
-
(2007)
Journal of Materials Science: Materials in Electronics
, vol.18
, Issue.1-3
, pp. 319-330
-
-
Frear, D.R.1
-
11
-
-
51249178947
-
A microstructural study of the thermal fatigue failures of 60Sn-40Pb solder joints
-
Frear, D., Grivas, D. and Morris, J.W. Jr (1988), "A microstructural study of the thermal fatigue failures of 60Sn-40Pb solder joints", Journal of Electronic Materials, Vol. 17 No. 2, pp. 171-80.
-
(1988)
Journal of Electronic Materials
, vol.17
, Issue.2
, pp. 171-180
-
-
Frear, D.1
Grivas, D.2
Morris Jr., J.W.3
-
12
-
-
51249173665
-
Parameters affecting thermal fatigue behavior of 60Sn-40Pb solder joints
-
Frear, D., Grivas, D. and Morris, J.W. Jr (1989), "Parameters affecting thermal fatigue behavior of 60Sn-40Pb solder joints", Journal of Electronic Materials, Vol. 18 No. 6, pp. 671-80.
-
(1989)
Journal of Electronic Materials
, vol.18
, Issue.6
, pp. 671-680
-
-
Frear, D.1
Grivas, D.2
Morris Jr., J.W.3
-
13
-
-
51549112537
-
Emerging reliability challenges in electronic packaging
-
Frear, D., Ramanathan, L., Jang, J.-W. and Owens, N.L. (2008), "Emerging reliability challenges in electronic packaging", 2008 IEEE International Reliability Physics Symposium.
-
(2008)
2008 IEEE International Reliability Physics Symposium
-
-
Frear, D.1
Ramanathan, L.2
Jang, J.-W.3
Owens, N.L.4
-
14
-
-
77955510771
-
Effect of alloying elements on properties and microstructures of SnAgCu solders
-
Gao, L., Xue, S., Zhang, L., Sheng, Z., Ji, F., Dai, W., Yu, S.l. and Zeng, G. (2010), "Effect of alloying elements on properties and microstructures of SnAgCu solders", Microelectronic Engineering, Vol. 87 No. 11, pp. 2025-34.
-
(2010)
Microelectronic Engineering
, vol.87
, Issue.11
, pp. 2025-2034
-
-
Gao, L.1
Xue, S.2
Zhang, L.3
Sheng, Z.4
Ji, F.5
Dai Yu W, S.L.6
Zeng, G.7
-
15
-
-
84858029669
-
Reliability and quality aspects of FBGA solder joints
-
GmbH, Q.D. and Co. OHG
-
Grafe, J., Garcia, R., Labayen, M., Grassme, O., Ganeshan, V., Nocke, K., Breuer, D., GmbH, Q.D. and Co. OHG (2008), "Reliability and quality aspects of FBGA solder joints", Forschung & Technologie, Vol. 10, pp. 2224-34.
-
(2008)
Forschung & Technologie
, vol.10
, pp. 2224-2234
-
-
Grafe, J.1
Garcia, R.2
Labayen, M.3
Grassme, O.4
Ganeshan, V.5
Nocke, K.6
Breuer, D.7
-
16
-
-
77955117137
-
Addressing industry knowledge gaps regarding new Pb-free solder alloy alternatives
-
Henshall, G., Healey, R., Pandher, R.S., Sweatman, K. and Howell, K. (2008), "Addressing industry knowledge gaps regarding new Pb-free solder alloy alternatives", Proceedings IEMT.
-
(2008)
Proceedings IEMT
-
-
Henshall, G.1
Healey, R.2
Pandher, R.S.3
Sweatman, K.4
Howell, K.5
-
17
-
-
70449954354
-
Addressing opportunities and risks of pb-free solder alloy alternatives
-
Henshall, G., Healey, R., Pandher, R.S., Sweatman, K., Howell, K. and Coyle, R. (2009), "Addressing opportunities and risks of pb-free solder alloy alternatives", Proceedings EMPC, Rimini.
-
(2009)
Proceedings EMPC, Rimini
-
-
Henshall, G.1
Healey, R.2
Pandher, R.S.3
Sweatman, K.4
Howell, K.5
Coyle, R.6
-
18
-
-
0034828282
-
Reliability of lead free solder joint by using chip size package
-
Hirano, T., Fukuda, K., Ito, K., Kiga, T. and Taniguchi, Y. (2001), "Reliability of lead free solder joint by using chip size package", Proceedings of the 2001 IEEE International Symposium on Electronics and the Environment.
-
(2001)
Proceedings of the 2001 IEEE International Symposium on Electronics and the Environment
-
-
Hirano, T.1
Fukuda, K.2
Ito, K.3
Kiga, T.4
Taniguchi, Y.5
-
19
-
-
42949141515
-
-
Taylor and Francis Group, Boca Raton, FL
-
Hosford, W.F. (2005), Physical Metallurgy, Taylor and Francis Group, Boca Raton, FL.
-
(2005)
Physical Metallurgy
-
-
Hosford, W.F.1
-
20
-
-
21844454177
-
Effects of Cu, Bi and in on microstructure and tensile properties of SnAg-X (Cu, Bi, In) solders
-
Huang, M.L. and Wang, L. (2004), "Effects of Cu, Bi and In on microstructure and tensile properties of SnAg-X (Cu, Bi, In) solders", Metallurgical and Materials Transactions A, Vol. 36, pp. 1439-46.
-
(2004)
Metallurgical and Materials Transactions A
, vol.36
, pp. 1439-1446
-
-
Huang, M.L.1
Wang, L.2
-
21
-
-
0033222086
-
Effect of thermal cycles on the mechanical strength of quad flat pack leads/Sn-3.5Ag-X (X = Bi and Cu) solder joints
-
Kariya, Y., Hirata, Y. and Otsuka, M. (1999), "Effect of thermal cycles on the mechanical strength of quad flat pack leads/Sn-3.5 Ag-X (X= Bi and Cu) solder joints", Journal of Electronic Materials, Vol. 28 No. 11, pp. 1263-9. (Pubitemid 32082863)
-
(1999)
Journal of Electronic Materials
, vol.28
, Issue.11
, pp. 1263-1269
-
-
Kariya, Y.1
Hirata, Y.2
Otsuka, M.3
-
22
-
-
2342640135
-
Effect of silver content on the shear fatigue properties of Sn-Ag-Cu flip-chip interconnects
-
Kariya, Y., Hosoi, T., Kimura, T., Terashima, S., Tanaka, M. and Suga, T. (2004), "Effect of silver content on the shear fatigue properties of Sn-Ag-Cu flip-chip interconnects", Journal of Electronic Materials, Vol. 33 No. 4, pp. 321-8.
-
(2004)
Journal of Electronic Materials
, vol.33
, Issue.4
, pp. 321-328
-
-
Kariya, Y.1
Hosoi, T.2
Kimura, T.3
Terashima, S.4
Tanaka, M.5
Suga, T.6
-
23
-
-
0037302714
-
Effects of fourth alloying additive on microstructures and tensile properties of Sn-Ag-Cu alloy and joints with Cu
-
Kim, K., Huh, S. and Suganuma, K. (2003a), "Effects of fourth alloying additive on microstructures and tensile properties of Sn-Ag-Cu alloy and joints with Cu", Microelectronics Reliability, Vol. 43 No. 2, pp. 259-67.
-
(2003)
Microelectronics Reliability
, vol.43
, Issue.2
, pp. 259-267
-
-
Kim, K.1
Huh, S.2
Suganuma, K.3
-
24
-
-
0037463944
-
Effects of intermetallic compounds on properties of Sn-Ag-Cu leadfree soldered joints
-
Kim, K., Huh, S. and Suganuma, K. (2003b), "Effects of intermetallic compounds on properties of Sn-Ag-Cu leadfree soldered joints", Journal of Alloys and Compounds, Vol. 352 Nos 1/2, pp. 226-36.
-
(2003)
Journal of Alloys and Compounds
, vol.352
, Issue.1-2
, pp. 226-236
-
-
Kim, K.1
Huh, S.2
Suganuma, K.3
-
25
-
-
35348876553
-
Evaluation of high compliant low Ag solder alloys on OSP as a drop solution for the 2nd level Pbfree interconnection
-
Kim, D., Suh, D., Millard, T., Kim, H., Kumar, C., Zhu, M. and Xu, Y. (2007a), "Evaluation of high compliant low Ag solder alloys on OSP as a drop solution for the 2nd level Pbfree interconnection", Proceedings of the 57th Electronic Components and Technology Conference, Reno, NV, May.
-
(2007)
Proceedings of the 57th Electronic Components and Technology Conference, Reno, NV, May
-
-
Kim, D.1
Suh, D.2
Millard, T.3
Kim, H.4
Kumar, C.5
Zhu, M.6
Xu, Y.7
-
26
-
-
35348848383
-
Improved drop reliability performance with lead free solders of low Ag content and their failure modes
-
Kim, H., Zhang, M., Kumar, C., Liu, P., Kim, D., Xie, M. and Wang, Z. (2007b), "Improved drop reliability performance with lead free solders of low Ag content and their failure modes", Proceedings of the Electronic Components and Technology Conference, IEEE, New York, NY, USA.
-
(2007)
Proceedings of the Electronic Components and Technology Conference, IEEE, New York, NY, USA
-
-
Kim, H.1
Zhang, M.2
Kumar, C.3
Liu, P.4
Kim, D.5
Xie, M.6
Wang, Z.7
-
28
-
-
35348910719
-
Effect of Ni addition on bending properties of Sn-Ag-Cu lead-free solder joints
-
Kobayashi, T., Kariya, Y., Sasaki, T., Tanaka, M. and Tatsumi, K. (2007), "Effect of Ni addition on bending properties of Sn-Ag-Cu lead-free solder joints", Proceedings 57th Electronic Components and Technology Conference.
-
(2007)
Proceedings 57th Electronic Components and Technology Conference
-
-
Kobayashi, T.1
Kariya, Y.2
Sasaki, T.3
Tanaka, M.4
Tatsumi, K.5
-
29
-
-
18644362229
-
Assessment of board level solder joint reliability for PBGA assemblies with lead-free solders
-
Lee, S.W.R., Lui, B.H.W, Kong, Y.H., Baylon, B., Leung, T. and Umali, P. (2002), "Assessment of board level solder joint reliability for PBGA assemblies with lead-free solders", Soldering & Surface Mount Technology, Vol. 14 No. 3, pp. 46-50.
-
(2002)
Soldering & Surface Mount Technology
, vol.14
, Issue.3
, pp. 46-50
-
-
Lee, S.W.R.1
Lui, B.H.W.2
Kong, Y.H.3
Baylon, B.4
Leung, T.5
Umali, P.6
-
30
-
-
77955107419
-
The superior drop test performance of SAC-Ti solders and its mechanism
-
Liu, W., Bachorik, P. and Lee, N.C. (2008), "The superior drop test performance of SAC-Ti solders and its mechanism", Proceedings of the Electronic Components and Technology Conference, IEEE, Las Vegas, NV.
-
(2008)
Proceedings of the Electronic Components and Technology Conference, IEEE, Las Vegas, NV
-
-
Liu, W.1
Bachorik, P.2
Lee, N.C.3
-
31
-
-
70349666702
-
Achieving high reliability low cost lead-free SAC solder joints via Mn or Ce doping
-
Liu, W., Lee, N.C. and Bachorik, P. (2009), "Achieving high reliability low cost lead-free SAC solder joints via Mn or Ce doping", Proceedings of the 58th Electronic Components and Technology Conference, IEEE, Utica, NY, USA.
-
(2009)
Proceedings of the 58th Electronic Components and Technology Conference, IEEE, Utica, NY, USA
-
-
Liu, W.1
Lee, N.C.2
Bachorik, P.3
-
33
-
-
11244324139
-
Impact of printed wiring board coatings on the reliability of lead-free chip-scale package interconnections
-
DOI 10.1557/JMR.2004.0436
-
Mattila, T., Vuorinen, V. and Kivilahti, J.K. (2004), "Impact of printed wiring board coatings on the reliability of leadfree chip-scale package interconnections", Journal of Materials Research, Vol. 19 No. 11, pp. 3214-23. (Pubitemid 40055653)
-
(2004)
Journal of Materials Research
, vol.19
, Issue.11
, pp. 3214-3223
-
-
Mattila, T.T.1
Vuorinen, V.2
Kivilahti, J.K.3
-
34
-
-
78651275560
-
Failure mechanism of solder interconnections under thermal cycling conditions
-
Mattila, T., Mueller, M., Paulasto-Krockel, M. and Wolter, K.-J. (2010), "Failure mechanism of solder interconnections under thermal cycling conditions", Proceedings of the IEEE Electronic System-Integration Technology Conference.
-
(2010)
Proceedings of the IEEE Electronic System-Integration Technology Conference
-
-
Mattila, T.1
Mueller, M.2
Paulasto-Krockel, M.3
Wolter, K.-J.4
-
35
-
-
0034297162
-
Experimental and thermodynamic assessment of Sn-Ag-Cu solder alloys
-
Moon, K.W., Boettinger, W.J., Kattner, U.R. and Biancaniello, F.S. (2000), "Experimental and thermodynamic assessment of Sn-Ag-Cu solder alloys", Journal of Electronic Materials, Vol. 29 No. 10, pp. 1122-36.
-
(2000)
Journal of Electronic Materials
, vol.29
, Issue.10
, pp. 1122-1136
-
-
Moon, K.W.1
Boettinger, W.J.2
Kattner, U.R.3
Biancaniello, F.S.4
-
37
-
-
35348814909
-
Drop shock reliability of lead-free alloys-effect of micro-additives
-
Pandher, R.S., Lewis, B.G., Vangaveti, R. and Singh, B. (2007), "Drop shock reliability of lead-free alloys-effect of micro- additives", IEEE on Electronic Components and Technology Conference.
-
(2007)
IEEE on Electronic Components and Technology Conference
-
-
Pandher, R.S.1
Lewis, B.G.2
Vangaveti, R.3
Singh, B.4
-
38
-
-
33845588217
-
Drop impact analysis of Sn-Ag-Cu solder joints using dynamic high-strain rate plastic strain as the impact damage driving force
-
Pang, J.H.L. and Che, F. (2006), "Drop impact analysis of Sn-Ag-Cu solder joints using dynamic high-strain rate plastic strain as the impact damage driving force", IEEE on Electronic Components and Technology Conference.
-
(2006)
IEEE on Electronic Components and Technology Conference
-
-
Pang, J.H.L.1
Che, F.2
-
39
-
-
0037674774
-
Bulk solder and solder joint properties for lead free 95.5 Sn-3.8 Ag-0.7 Cu solder alloy
-
Pang, J.H.L., Xiong, B.S., Neo, C.C., Zhang, X.R. and Low, T.H. (2003), "Bulk solder and solder joint properties for lead free 95.5 Sn-3.8 Ag-0.7 Cu solder alloy", IEEE Electronic Components and Technology Conference.
-
(2003)
IEEE Electronic Components and Technology Conference
-
-
Pang, J.H.L.1
Xiong, B.S.2
Neo, C.C.3
Zhang, X.R.4
Low, T.H.5
-
40
-
-
70349683448
-
Materials technology for environmentally green micro-electronic packaging
-
Renavikar, M.P., Patel, N., Dani, A., Wakharkar, V., Arrigotti, G., Vasudevan, V., Bchir, O., Alur, A.P., Gurumurthy, C.K. and Stage, R.W. (2008),"Materials technology for environmentally green micro-electronic packaging", Intelw Technology Journal, Vol. 12, pp. 12-16.
-
(2008)
Intelw Technology Journal
, vol.12
, pp. 12-16
-
-
Renavikar, M.P.1
Patel, N.2
Dani, A.3
Wakharkar, V.4
Arrigotti, G.5
Vasudevan, V.6
Bchir, O.7
Alur, A.P.8
Gurumurthy, C.K.9
Stage, R.W.10
-
41
-
-
0024054439
-
Mechanisms of fatigue crack propagation in metals, ceramics and composites: Role of crack tip shielding
-
Ritchie, R. (1988), "Mechanisms of fatigue crack propagation in metals, ceramics and composites: role of crack tip shielding", Materials Science and Engineering: A, Vol. 103 No. 1, pp. 15-28.
-
(1988)
Materials Science and Engineering: A
, vol.103
, Issue.1
, pp. 15-28
-
-
Ritchie, R.1
-
42
-
-
84858039376
-
A review on thermal cycling and drop impact reliability of SAC solder joint in portable electronic products
-
Shnawah, D.A., Sabri, M.F.M. and Badruddin, I.A. (2011), "A review on thermal cycling and drop impact reliability of SAC solder joint in portable electronic products", Microelectronics Reliability, August.
-
(2011)
Microelectronics Reliability, August
-
-
Shnawah, D.A.1
Sabri, M.F.M.2
Badruddin, I.A.3
-
43
-
-
0036606224
-
Are lead-free solder joints reliable?
-
Sohn, J.E. (2002), "Are lead-free solder joints reliable?", Circuits Assembly, Vol. 13 No. 6, pp. 32-5.
-
(2002)
Circuits Assembly
, vol.13
, Issue.6
, pp. 32-35
-
-
Sohn, J.E.1
-
44
-
-
0038818002
-
Physical metallurgy inleadfree electronic solder development
-
Subramanian, K. and Lee, J. (2003), "Physical metallurgy inleadfree electronic solder development", JOM Journal of the Minerals, Metals & Materials Society, Vol. 55 No. 5, pp. 26-32.
-
(2003)
JOM Journal of the Minerals, Metals & Materials Society
, vol.55
, Issue.5
, pp. 26-32
-
-
Subramanian, K.1
Lee, J.2
-
45
-
-
0035047957
-
Advances in lead-free electronics soldering
-
DOI 10.1016/S1359-0286(00)00036-X, PII S135902860000036X
-
Suganuma, K. (2001), "Advances in lead-free electronics soldering", Current Opinion in Solid State and Materials Science, Vol. 5 No. 1, pp. 55-64. (Pubitemid 32320603)
-
(2001)
Current Opinion in Solid State and Materials Science
, vol.5
, Issue.1
, pp. 55-64
-
-
Suganuma, K.1
-
46
-
-
34247145459
-
Effects of Ag content on fracture resistance of Sn-Ag-Cu lead-free solders under high-strain rate conditions
-
DOI 10.1016/j.msea.2007.01.145, PII S0921509307001852
-
Suh, D., Kim, D.W. and Liu, P. (2007), "Effects of Ag content on fracture resistance of Sn-Ag-Cu lead-free solders under high-strain rate conditions", Materials Science and Engineering: A, Vol. 460, pp. 595-603. (Pubitemid 46593846)
-
(2007)
Materials Science and Engineering A
, vol.460-461
, pp. 595-603
-
-
Suh, D.1
Kim, D.W.2
Liu, P.3
Kim, H.4
Weninger, J.A.5
Kumar, C.M.6
Prasad, A.7
Grimsley, B.W.8
Tejada, H.B.9
-
47
-
-
0035019280
-
Reliability and Au embrittlement of lead free solders for BGA applications
-
paper presented at the
-
Syed, A. (2001), "Reliability and Au embrittlement of lead free solders for BGA applications", paper presented at the International Symposium on Advanced Packaging Materials.
-
(2001)
International Symposium on Advanced Packaging Materials
-
-
Syed, A.1
-
48
-
-
70449883161
-
Alternate solder balls for improving drop/shock reliability
-
Syed, A., Kim, T. and Cha, S. (2007), "Alternate solder balls for improving drop/shock reliability", Surface Mount Technology Association International, p. 390.
-
(2007)
Surface Mount Technology Association International
, pp. 390
-
-
Syed, A.1
Kim, T.2
Cha, S.3
-
49
-
-
35348912923
-
Alloying effect of Ni, Co, and Sb in SAC solder for improved drop performance of chip scale packages with Cu OSP pad finish
-
Syed, A., Kim, T.S., Cho, Y.M., Kim, C.W. and Yoo, M. (2006), "Alloying effect of Ni, Co, and Sb in SAC solder for improved drop performance of chip scale packages with Cu OSP pad finish", Proceedings of the IEEE 8th Electronics Packaging Technology Conference.
-
(2006)
Proceedings of the IEEE 8th Electronics Packaging Technology Conference
-
-
Syed, A.1
Kim, T.S.2
Cho, Y.M.3
Kim, C.W.4
Yoo, M.5
-
50
-
-
51349101863
-
Impact of package design and materials on reliability for temperature cycling, bend, and drop loading conditions
-
Syed, A., Scanlan, J., Cha, S., Kang, W., Sohn, E. and Kim, T. (2008), "Impact of package design and materials on reliability for temperature cycling, bend, and drop loading conditions", Proceedings of the 58th IEEE-ECTC Conference.
-
(2008)
Proceedings of the 58th IEEE-ECTC Conference
-
-
Syed, A.1
Scanlan, J.2
Cha, S.3
Kang, W.4
Sohn, E.5
Kim, T.6
-
51
-
-
0942299489
-
Effect of silver content on thermal fatigue life of Sn-xAg-0.5 Cu flipchip interconnects
-
Terashima, S., Kariya, Y. and Hosoi, T. (2003), "Effect of silver content on thermal fatigue life of Sn-xAg-0.5 Cu flipchip interconnects", Journal of Electronic Materials, Vol. 32 No. 12, pp. 1527-33.
-
(2003)
Journal of Electronic Materials
, vol.32
, Issue.12
, pp. 1527-1533
-
-
Terashima, S.1
Kariya, Y.2
Hosoi, T.3
-
52
-
-
2442443049
-
Improvement on thermal fatigue properties of Sn-1.2 Ag-0.5 Cu flip chip interconnects by nickel addition
-
Terashima, S., Kariya, Y. and Tanaka, M. (2004), "Improvement on thermal fatigue properties of Sn-1.2 Ag-0.5 Cu flip chip interconnects by nickel addition", Materials Transactions-JIM, Vol. 45 No. 3, pp. 673-80.
-
(2004)
Materials Transactions-JIM
, vol.45
, Issue.3
, pp. 673-680
-
-
Terashima, S.1
Kariya, Y.2
Tanaka, M.3
-
53
-
-
57649171539
-
Improvement of thermal fatigue properties of Sn-Ag-Cu lead-free solder interconnects on Casio's wafer-level packages based onmorphology and grain boundary character
-
Terashima, S., Kohno, T., Mizusawa, A., Arai, K., Okada, O., Wakabayashi, T., Tanaka, M. and Tatsumi, K. (2009), "Improvement of thermal fatigue properties of Sn-Ag-Cu lead-free solder interconnects on Casio's wafer-level packages based onmorphology and grain boundary character", Journal of Electronic Materials, Vol. 38 No. 1, pp. 33-8.
-
(2009)
Journal of Electronic Materials
, vol.38
, Issue.1
, pp. 33-38
-
-
Terashima, S.1
Kohno, T.2
Mizusawa, A.3
Arai, K.4
Okada, O.5
Wakabayashi, T.6
Tanaka, M.7
Tatsumi, K.8
-
54
-
-
24644512312
-
Identification of mechanical properties of intermetallic compounds on lead free solder
-
Tsai, I., Tai, L.J., Yen, S.F., Chuang, T.H., Wu, E., Lo, R. and Ku, T. (2005), "Identification of mechanical properties of intermetallic compounds on lead free solder", IEEE Electronic Components and Technology Conference.
-
(2005)
IEEE Electronic Components and Technology Conference
-
-
Tsai, I.1
Tai, L.J.2
Yen, S.F.3
Chuang, T.H.4
Wu, E.5
Lo, R.6
Ku, T.7
-
55
-
-
33750094646
-
Wave soldering using Sn/3.0Ag/0.5Cu solder and water soluble VOC-free flux
-
DOI 10.1109/TEPM.2006.882500
-
Wable, G., Chu, Q., Damodaran, P. and Srihari, K. (2006), "Wave soldering using Sn/3.0 Ag/0.5 Cu solder and water soluble VOC-free flux", IEEE Transactions on Electronics Packaging Manufacturing, Vol. 29 No. 3, pp. 202-10. (Pubitemid 44592866)
-
(2006)
IEEE Transactions on Electronics Packaging Manufacturing
, vol.29
, Issue.3
, pp. 202-210
-
-
Wable, G.1
Chu, Q.2
Damodaran, P.3
Srihari, K.4
-
56
-
-
1642324965
-
Properties of leadfree solder alloys with rare earth element additions
-
Wu, C., Yu, D., Law, C. and Wang, L. (2004),"Properties of leadfree solder alloys with rare earth element additions", Materials Science and Engineering: R: Reports, Vol. 44 No. 1, pp. 1-44.
-
(2004)
Materials Science and Engineering: R: Reports
, vol.44
, Issue.1
, pp. 1-44
-
-
Wu, C.1
Yu, D.2
Law, C.3
Wang, L.4
-
57
-
-
0034760184
-
Microstructure investigation of Sn-0.5Cu-3.5Ag and Sn-3.5Ag-0.5Cu-0.5B lead-free solders
-
DOI 10.1108/EUM0000000006025
-
Ye, L., Lai, Z., Liu, J. and Thölén, A. (2001), "Microstructure investigation of Sn-0.5 Cu-3.5 Ag and Sn-3.5 Ag-0.5 Cu-0.5 B lead-free solders", Soldering & Surface Mount Technology, Vol. 13 No. 3, pp. 16-20. (Pubitemid 33039054)
-
(2001)
Soldering and Surface Mount Technology
, vol.13
, Issue.3
, pp. 16-20
-
-
Ye, L.1
Lai, Z.H.2
Liu, J.3
Tholen, A.4
-
58
-
-
77955187212
-
Improved reliability of Sn-Ag-Cu-In solder alloy by the addition of minor elements
-
Yu, A., Jang, J.W., Kim, J.-K., Lee, J.-H. and Kim, M.-S. (2010), "Improved reliability of Sn-Ag-Cu-In solder alloy by the addition of minor elements", Proceedings of the Electronic Components & Technology Conference.
-
(2010)
Proceedings of the Electronic Components & Technology Conference
-
-
Yu, A.1
Jang, J.W.2
Kim, J.-K.3
Lee, J.-H.4
Kim, M.-S.5
-
59
-
-
67349228728
-
Reliability study of board-level lead-free interconnections under sequential thermal cycling and drop impact
-
Zhang, B., Ding, H. and Sheng, X. (2009), "Reliability study of board-level lead-free interconnections under sequential thermal cycling and drop impact", Microelectronics Reliability, Vol. 49 No. 5, pp. 530-6.
-
(2009)
Microelectronics Reliability
, vol.49
, Issue.5
, pp. 530-536
-
-
Zhang, B.1
Ding, H.2
Sheng, X.3
-
60
-
-
0036867861
-
Failure mechanism of lead-free solder joints in flip chip packages
-
Zhang, F., Li, M., Balakrisnan, B. and Chen, W.T. (2002), "Failure mechanism of lead-free solder joints in flip chip packages", Journal of Electronic Materials, Vol. 31 No. 11, pp. 1256-63.
-
(2002)
Journal of Electronic Materials
, vol.31
, Issue.11
, pp. 1256-1263
-
-
Zhang, F.1
Li, M.2
Balakrisnan, B.3
Chen, W.T.4
-
61
-
-
2942630857
-
Influence of Bi on microstructures evolution and mechanical properties in Sn-Ag-Cu lead-free solder
-
Zhao, J., Qi, L., Wang, X. and Wang, L. (2004), "Influence of Bi on microstructures evolution and mechanical properties in Sn-Ag-Cu lead-free solder", Journal of Alloys and Compounds, Vol. 375 Nos 1/2, pp. 196-201.
-
(2004)
Journal of Alloys and Compounds
, vol.375
, Issue.1-2
, pp. 196-201
-
-
Zhao, J.1
Qi, L.2
Wang, X.3
Wang, L.4
|