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Volumn 460-461, Issue , 2007, Pages 595-603

Effects of Ag content on fracture resistance of Sn-Ag-Cu lead-free solders under high-strain rate conditions

Author keywords

Drop testing; Extrinsic toughening; Fracture; Lead free solder; Sn Ag Cu

Indexed keywords

CHEMISTRY; COMPOSITION EFFECTS; FRACTURE TOUGHNESS; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); INTERMETALLICS; SILVER; STRAIN RATE; TIN ALLOYS; TOUGHENING;

EID: 34247145459     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2007.01.145     Document Type: Article
Times cited : (146)

References (18)
  • 1
    • 85161685571 scopus 로고    scopus 로고
    • C.M. Kumar, Internal Report, Intel Corporation, 2006.
  • 2
    • 85161637153 scopus 로고    scopus 로고
    • JEDEC Standard No. 22-B111, Board Level Drop Test Method of Components for Handheld Electronic Products, Arlington, JEDEC Solid State Technology Association, 2002.
  • 10
    • 85161676104 scopus 로고    scopus 로고
    • M. Mello, Internal Report, Intel Corporation, 2004.
  • 18
    • 85161689328 scopus 로고    scopus 로고
    • C.R. Kao, 2006, private communication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.