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Volumn , Issue , 2003, Pages 673-679

Bulk solder and solder joint properties for lead free 95.5Sn-3.8Ag-0.7Cu solder alloy

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; MATERIALS TESTING; MICROSTRUCTURE; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SOLDERED JOINTS; STRAIN RATE; TEMPERATURE; TENSILE STRENGTH; TENSILE TESTING; TIN ALLOYS; VACUUM;

EID: 0037674774     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (85)

References (9)
  • 2
    • 0038140905 scopus 로고    scopus 로고
    • NEMI Pb-free Task Group Report, 2002 APEX Free Forum January 23; National Electronics Manufacturing Initiative, Inc.
    • Edwin Bradley et al., NEMI Pb-free Task Group Report, 2002 APEX Free Forum January 23, 2002, National Electronics Manufacturing Initiative, Inc.
    • (2002)
    • Bradley, E.1
  • 3
    • 0034297797 scopus 로고    scopus 로고
    • Analysis of ring and plug shear strengths for comparison of lead free solders
    • J.C. Foley, A. Gickler, F.H. Leprevost, and D. Brown, "Analysis of Ring and Plug Shear Strengths for Comparison of Lead Free Solders", JEM, Vol 29, No. 10, 2000, pp 1258-1263.
    • (2000) JEM , vol.29 , Issue.10 , pp. 1258-1263
    • Foley, J.C.1    Gickler, A.2    Leprevost, F.H.3    Brown, D.4
  • 5
    • 0036575439 scopus 로고    scopus 로고
    • Low cycle fatigue behavior of Sn-Ag, Sn-Ag-Cu and Sn-Ag-Cu-Bi lead-free solders
    • Chaosuan Kanchanomai, Yukio Miyashita and Yoshiharu Mutoh, "Low Cycle Fatigue Behavior of Sn-Ag, Sn-Ag-Cu and Sn-Ag-Cu-Bi Lead-free Solders". Journal of Electronic Materials, Vol. 31, 2002, pp456-465
    • (2002) Journal of Electronic Materials , vol.31 , pp. 456-465
    • Kanchanomai, C.1    Miyashita, Y.2    Mutoh, Y.3
  • 6
    • 0035877138 scopus 로고    scopus 로고
    • Microstructure and intermetallic growth effects on shear and fatigue strength of solder joints subjected to thermal cycling aging
    • H. L. J. Pang, K. H. Tan, X. Q. Shi, and Z. P. Wang, "Microstructure and intermetallic growth effects on shear and fatigue strength of solder joints subjected to thermal cycling aging", Materials Science and Engineering A307, 2001, pp42-50.
    • (2001) Materials Science and Engineering , vol.A307 , pp. 42-50
    • Pang, H.L.J.1    Tan, K.H.2    Shi, X.Q.3    Wang, Z.P.4
  • 7
    • 18644381608 scopus 로고    scopus 로고
    • Reactions between Sn-Ag-Cu lead-free solders and Au/Ni surface finish in advanced electronic packages
    • L.C. Shiau, C.E. Ho, C.R. Kao "Reactions between Sn-Ag-Cu lead-free solders and Au/Ni surface finish in advanced electronic packages", Soldering & Surface Mount Technology, Vol. 14, No. 3, 2002, pp25-29.
    • (2002) Soldering & Surface Mount Technology , vol.14 , Issue.3 , pp. 25-29
    • Shiau, L.C.1    Ho, C.E.2    Kao, C.R.3
  • 8
    • 0345867339 scopus 로고    scopus 로고
    • Effect of temperature and strain rate on mechanical properties of 63Sn/37Pb solder alloy
    • September
    • X.Q. Shi, W. Zhou, H.L.J. Pang, and Z.P. Wang, "Effect of temperature and strain rate on mechanical properties of 63Sn/37Pb solder alloy" Transactions of ASME, Journal of Electronic Packaging, Vol. 121, September 1999, pp179-185.
    • (1999) Transactions of ASME, Journal of Electronic Packaging , vol.121 , pp. 179-185
    • Shi, X.Q.1    Zhou, W.2    Pang, H.L.J.3    Wang, Z.P.4
  • 9
    • 0036680482 scopus 로고    scopus 로고
    • Effects of cooling speed on microstructure and tensile properties of Sn-Ag-Cu alloys
    • K.S. Kim, S.H. Huh and K. Suganuma "Effects of cooling speed on microstructure and tensile properties of Sn-Ag-Cu alloys" Materials Science and Engineering, 2002, pp106-114.
    • (2002) Materials Science and Engineering , pp. 106-114
    • Kim, K.S.1    Huh, S.H.2    Suganuma, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.