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Volumn 2006, Issue , 2006, Pages 49-54

Drop impact analysis of Sn-Ag-Cu solder joints using dynamic high-strain rate plastic strain as the impact damage driving force

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COPPER; FAILURE (MECHANICAL); MATHEMATICAL MODELS; PLASTIC DEFORMATION; SILVER; STRAIN; TIN;

EID: 33845588217     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2006.1645625     Document Type: Conference Paper
Times cited : (41)

References (10)
  • 3
    • 2942740958 scopus 로고    scopus 로고
    • Impact life prediction modeling of TFBGA packages under board level drop test
    • Tee, T.Y., Ng, H.S., Lim, C.T., et al., "Impact Life Prediction Modeling of TFBGA Packages under Board Level Drop Test", Microelectronics Reliability, Vol. 44, (2004), pp. 1131-1142.
    • (2004) Microelectronics Reliability , vol.44 , pp. 1131-1142
    • Tee, T.Y.1    Ng, H.S.2    Lim, C.T.3
  • 5
    • 4444374713 scopus 로고    scopus 로고
    • Flip chip on board: Assessment of reliability in cellular phone application
    • Sillanpää, M, Okura J.H., "Flip Chip on Board: Assessment of Reliability in Cellular Phone Application", IEEE Trans-Components and Packaging Technologies, Vol. 27, No.3(2004), pp.461-467.
    • (2004) IEEE Trans-components and Packaging Technologies , vol.27 , Issue.3 , pp. 461-467
    • Sillanpää, M.1    Okura, J.H.2
  • 6
    • 0038351732 scopus 로고    scopus 로고
    • Modeling technique for reliability assessment of portable electronic product subjected to drop impact loads
    • New Orleans
    • rd Electronic Components and Technology Conf, New Orleans, 2003, pp. 100-104.
    • (2003) rd Electronic Components and Technology Conf , pp. 100-104
    • Zhu, L.P.1
  • 7
    • 3843127800 scopus 로고    scopus 로고
    • Submodeling technique for BGA reliability analysis of CSP packaging subjected to an impact loading
    • Kauai, Hawaii, July. IPACK2001-15873
    • Zhu, L.P., "Submodeling Technique for BGA Reliability Analysis of CSP Packaging Subjected to an Impact Loading", Pro IPACK'01, Kauai, Hawaii, July. IPACK2001-15873: pp. 1-9.
    • Pro IPACK'01 , pp. 1-9
    • Zhu, L.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.