High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

Review of Scientific Instruments

Volumn 74, Issue 8, 2003, Pages 3656-3663

  Oral, A ^a   Grimble, R A ^a   Ozer H O ^a,b   Pethica, J B ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b BILKENT UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; INTERFEROMETERS; LOW ENERGY ELECTRON DIFFRACTION; OSCILLATIONS; RESONANCE; SCANNING TUNNELING MICROSCOPY; ULTRAHIGH VACUUM;

ATOMIC RESOLUTION IMAGING;

ATOMIC FORCE MICROSCOPY;

EID: 0042377551     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1593786     Document Type: Article

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