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Journal of Vacuum Science and Technology B

Volumn 28, Issue 3, 2010, Pages

Simultaneous atomic force and scanning tunneling microscopy study of the Ge (111)-c (2×8) surface

(5) Sawada, Daisuke a Sugimoto, Yoshiaki a Morita, Ken Ichi a Abe, Masayuki a Morita, Seizo a

a OSAKA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON TUNNELING;

ATOMIC FORCE AND SCANNING TUNNELING MICROSCOPY; CURRENT IMAGE; FREQUENCY SHIFT; GE(111); MEASUREMENTS OF; SCANNING TUNNELLING SPECTROSCOPY; SHIFT-AND; SITE-SPECIFIC; TIME-AVERAGED; TUNNELING CURRENT;

SCANNING TUNNELING MICROSCOPY;

EID: 77953010667 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3305340 Document Type: Conference Paper

Times cited : (5)

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