메뉴 건너뛰기




Volumn 66, Issue SUPPL. 1, 1998, Pages

Comparison of dynamic lever STM and noncontact AFM

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CONSTANT FREQUENCY; CONSTANT TIME; FORCE SPECTROSCOPY; FREQUENCY SHIFT; INTERACTION EFFECT; NON-CONTACT; RESONANCE FREQUENCIES; SCANNING TUNNELING MICROSCOPY (STM); SI (1 1 1); TRUE ATOMIC RESOLUTION;

EID: 0001073218     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051139     Document Type: Article
Times cited : (29)

References (19)
  • 2
    • 0003692711 scopus 로고
    • H.-J. Güntherodt, D. Anselmetti, E. Meyer (Eds.), NATO ASI Series E: Applied Sciences, (Kluwer Academic, Dordrecht)
    • H.-J. Güntherodt, D. Anselmetti, E. Meyer (Eds.): Forces in Scanning Probe Methods, NATO ASI Series E: Applied Sciences Vol. 286, (Kluwer Academic, Dordrecht 1995)
    • (1995) Forces in Scanning Probe Methods , vol.286


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.