Simultaneous imaging of tunneling current variation by noncontact atomic force microscopy in ultrahigh vacuum

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 6 B, 2000, Pages 3753-3757

  Arai, Toyoko ^a   Tomitori, Masahiko ^a  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

Constant frequency shift; Force interaction; nc AFM; Resonance; Si(111)7 7; Surface states; Tunneling current; UHV

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; ELECTRON ENERGY LEVELS; ELECTRON TUNNELING; IMAGING TECHNIQUES;

CHEMICAL ATTRACTIVE FORCE;

ELECTRIC CURRENTS;

EID: 0034205913     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3753     Document Type: Article

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