Quasi-one dimensional metal oxide semiconductors: Preparation, characterization and application as chemical sensors

Progress in Materials Science

Volumn 54, Issue 1, 2009, Pages 1-67

  Comini, E ^a   Baratto, C ^a   Faglia, G ^a   Ferroni, M ^a   Vomiero, A ^a   Sberveglieri, G ^a  

^a INFM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CHARGE COUPLED DEVICES; CHEMICAL PROPERTIES; CHEMICAL SENSORS; ELECTRIC PROPERTIES; ELECTRIC WIRE; GAS DETECTORS; KETONES; METALLIC COMPOUNDS; MOS DEVICES; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; OPTICAL SENSORS; SENSORS; SURFACE DEFECTS; SURFACES; SYSTEM STABILITY;

APPLIED SCIENCES; CATALYTIC ACTIVITIES; CHEMICAL COMPOSITIONS; CORE SHELLS; CRYSTALLINE STRUCTURES; DEGREE OF CRYSTALLINITY; ELECTRICAL PROPERTIES; EXTENDED DEFECTS; GAS SENSORS; GRAIN COALESCENCES; HIERARCHICAL STRUCTURES; METAL OXIDE MATERIALS; METAL OXIDES; MORPHO-LOGIES; NANOSIZED DIMENSIONS; NEW GENERATIONS; OPTICAL-; POLYCRYSTAL LINES; RESEARCH EFFORTS; SPECIFIC SURFACES; SURFACE ADSORPTIONS; SURFACE EFFECTS; SURFACE TERMINATIONS;

SURFACE PROPERTIES;

EID: 56349159501     PISSN: 00796425     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.pmatsci.2008.06.003     Document Type: Review

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