Rectifying junction in a single ZnO vertical nanowire

Applied Physics Letters

Volumn 89, Issue 23, 2006, Pages

  Pradhan, Basudev ^a   Batabyal, Sudip K ^a   Pal, Amlan J ^a  

^a DEPARTMENT OF MATERIALS SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DOPING (ADDITIVES); NUCLEATION; SEMICONDUCTOR JUNCTIONS; SINGLE CRYSTALS; ZINC OXIDE;

CRYSTAL NUCLEATION; NANOWIRE DIODE JUNCTIONS; RECTIFYING BEHAVIOR;

NANOSTRUCTURED MATERIALS;

EID: 33845458896     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2398899     Document Type: Article

References (15)

1. M. S. Gudiksen, L. J. Lauhon, J. Wang, D. C. Smith, and C. M. Lieber, Nature (London) 415, 617 (2002).
2. M. H. Huang, S. Mao, H. Feick, H. Yan, Y. Wu, H. Kind, E. Weber, R. Russo, and P. Yang, Science 292, 1897 (2001).
3. Y. Chai, X. L. Zhou, P. J. Li, W. J. Zhang, Q. F. Zhang, and J. L. Wu, Nanotechnology 16, 2134 (2005).
4. G. Cheng, A. Kolmakov, Y. Zhang, M. Moskovites, R. Munden, M. A. Reed, G. Wang, D. Mosses, and J. Zhang, Appl. Phys. Lett. 83, 1578 (2003).
5. S. Jang, J.-J. Chen, B. S. Kang, F. Ren, D. P. Norton, S. J. Pearton, J. Lopata, and W. S. Hobson, Appl. Phys. Lett. 87, 222113 (2005).
6. Y. R. Ryu, T. S. Lee, J. H. Leem, and H. W. White, Appl. Phys. Lett. 83, 4032 (2003).
7. Ü. Özgür, Ya. I. Alivov, C. Liu, A. Teke, M. A. Reshchikov, S. Doǧan, V. Avrutin, S.-J. Cho, and H. Morko̧, J. Appl. Phys. 98, 041301 (2005).
8. L. E. Greene, M. Law, D. H. Tan, M. Montano, J. Goldberger, G. Somorjai, and P. Yang, Nano Lett. 5, 1231 (2005).
9. C.-L. Hsu, S.-J. Chang, H.-C. Hung, Y.-R. Lin, C.-J. Huang, Y.-K. Tseng, and I.-C. Chen, J. Electrochem. Soc. 152, G378 (2005).
10. J. H. He, C. S. Lao, L. J. Chen, D. Davidovic, and Z. L. Wang, J. Am. Chem. Soc. 127, 16376 (2005).
11. C. H. Park, S. B. Zhang, and S.-H. Wei, Phys. Rev. B 66, 073202 (2002).
12. Z. Y. Zhang, C. H. Jin, X. L. Liang, Q. Chen, and L.-M. Peng, Appl. Phys. Lett. 88, 073102 (2006).
13. G. J. Ashwell, W. D. Tyrrell, and A. J. Whittam, J. Am. Chem. Soc. 126, 7102 (2004).
14. M. L. Chabinyc, X. Chen, R. E. Holmlin, H. Jacobs, H. Skulason, C. D. Frisbie, V. Mujica, M. A. Ratner, M. A. Rampi, and G. M. Whitesides, J. Am. Chem. Soc. 124, 11730 (2002).
15. JCPDS-International Center for Diffraction Data, Newton Square, PA, Card No. 36-1451.