-
2
-
-
12444310513
-
-
www.EIPBN.org
-
-
-
-
3
-
-
0036883171
-
-
Projection e-beam
-
For example (EUV) P. Nauilleau et al., J. Vac. Sci. Technol. B 20, 2829 (2002); (Projection e-beam) T. Miura, ibid. 20, 2622 (2002); (x ray) E. Toyota and M. Washio, ibid. 20, 2979 (2002); (DUV) V. Lieberman, M. Rothschild, P. G. Murphy, and S. T. Palmacci, ibid. 20, 2567 (2002); M. Fritze, B. Tyrrell, R. Mallen, B. Wheeler, P. Rhyins, and P. Martin, ibid. 20, 2589 (2002); (Projection ion beam) H. Loeschner, G. Stengl, R. Kaismaier, and A. Wolter, ibid. 19, 2520 (2001).
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, pp. 2829
-
-
Nauilleau, P.1
-
4
-
-
0036883137
-
-
x ray
-
For example (EUV) P. Nauilleau et al., J. Vac. Sci. Technol. B 20, 2829 (2002); (Projection e-beam) T. Miura, ibid. 20, 2622 (2002); (x ray) E. Toyota and M. Washio, ibid. 20, 2979 (2002); (DUV) V. Lieberman, M. Rothschild, P. G. Murphy, and S. T. Palmacci, ibid. 20, 2567 (2002); M. Fritze, B. Tyrrell, R. Mallen, B. Wheeler, P. Rhyins, and P. Martin, ibid. 20, 2589 (2002); (Projection ion beam) H. Loeschner, G. Stengl, R. Kaismaier, and A. Wolter, ibid. 19, 2520 (2001).
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, pp. 2622
-
-
Miura, T.1
-
5
-
-
0036883218
-
-
DUV
-
For example (EUV) P. Nauilleau et al., J. Vac. Sci. Technol. B 20, 2829 (2002); (Projection e-beam) T. Miura, ibid. 20, 2622 (2002); (x ray) E. Toyota and M. Washio, ibid. 20, 2979 (2002); (DUV) V. Lieberman, M. Rothschild, P. G. Murphy, and S. T. Palmacci, ibid. 20, 2567 (2002); M. Fritze, B. Tyrrell, R. Mallen, B. Wheeler, P. Rhyins, and P. Martin, ibid. 20, 2589 (2002); (Projection ion beam) H. Loeschner, G. Stengl, R. Kaismaier, and A. Wolter, ibid. 19, 2520 (2001).
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, pp. 2979
-
-
Toyota, E.1
Washio, M.2
-
6
-
-
0036883118
-
-
For example (EUV) P. Nauilleau et al., J. Vac. Sci. Technol. B 20, 2829 (2002); (Projection e-beam) T. Miura, ibid. 20, 2622 (2002); (x ray) E. Toyota and M. Washio, ibid. 20, 2979 (2002); (DUV) V. Lieberman, M. Rothschild, P. G. Murphy, and S. T. Palmacci, ibid. 20, 2567 (2002); M. Fritze, B. Tyrrell, R. Mallen, B. Wheeler, P. Rhyins, and P. Martin, ibid. 20, 2589 (2002); (Projection ion beam) H. Loeschner, G. Stengl, R. Kaismaier, and A. Wolter, ibid. 19, 2520 (2001).
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, pp. 2567
-
-
Lieberman, V.1
Rothschild, M.2
Murphy, P.G.3
Palmacci, S.T.4
-
7
-
-
0036883123
-
-
Projection ion beam
-
For example (EUV) P. Nauilleau et al., J. Vac. Sci. Technol. B 20, 2829 (2002); (Projection e-beam) T. Miura, ibid. 20, 2622 (2002); (x ray) E. Toyota and M. Washio, ibid. 20, 2979 (2002); (DUV) V. Lieberman, M. Rothschild, P. G. Murphy, and S. T. Palmacci, ibid. 20, 2567 (2002); M. Fritze, B. Tyrrell, R. Mallen, B. Wheeler, P. Rhyins, and P. Martin, ibid. 20, 2589 (2002); (Projection ion beam) H. Loeschner, G. Stengl, R. Kaismaier, and A. Wolter, ibid. 19, 2520 (2001).
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, pp. 2589
-
-
Fritze, M.1
Tyrrell, B.2
Mallen, R.3
Wheeler, B.4
Rhyins, P.5
Martin, P.6
-
8
-
-
0035519441
-
-
For example (EUV) P. Nauilleau et al., J. Vac. Sci. Technol. B 20, 2829 (2002); (Projection e-beam) T. Miura, ibid. 20, 2622 (2002); (x ray) E. Toyota and M. Washio, ibid. 20, 2979 (2002); (DUV) V. Lieberman, M. Rothschild, P. G. Murphy, and S. T. Palmacci, ibid. 20, 2567 (2002); M. Fritze, B. Tyrrell, R. Mallen, B. Wheeler, P. Rhyins, and P. Martin, ibid. 20, 2589 (2002); (Projection ion beam) H. Loeschner, G. Stengl, R. Kaismaier, and A. Wolter, ibid. 19, 2520 (2001).
-
(2001)
J. Vac. Sci. Technol. B
, vol.19
, pp. 2520
-
-
Loeschner, H.1
Stengl, G.2
Kaismaier, R.3
Wolter, A.4
-
13
-
-
12444332359
-
-
Tampa Bay, FL, 27-30 May
-
J. C. Wolfe, 47th EIPBN, Tampa Bay, FL, 27-30 May, 2003.
-
(2003)
47th EIPBN
-
-
Wolfe, J.C.1
-
14
-
-
0000220462
-
-
D. M. Tennant, J. E. Bjorkholm, M. L. O'Malley, M. M. Beeker, J. A. Gregus, and R. W. Epworth, J. Vac. Sci. Technol. B 8, 1975 (1990).
-
(1990)
J. Vac. Sci. Technol. B
, vol.8
, pp. 1975
-
-
Tennant, D.M.1
Bjorkholm, J.E.2
O'Malley, M.L.3
Beeker, M.M.4
Gregus, J.A.5
Epworth, R.W.6
-
16
-
-
0030110843
-
-
For recent reviews of Monte Carlo modeling of electron-solid interactions, see Z.-J. Ding and R. Shimizu, Scanning 18, 92 (1996); R. Shimizu and D. Ze-Jun, Rep. Prog. Phys. 55, 487 (1992).
-
(1996)
Scanning
, vol.18
, pp. 92
-
-
Ding, Z.-J.1
Shimizu, R.2
-
17
-
-
10444255254
-
-
For recent reviews of Monte Carlo modeling of electron-solid interactions, see Z.-J. Ding and R. Shimizu, Scanning 18, 92 (1996); R. Shimizu and D. Ze-Jun, Rep. Prog. Phys. 55, 487 (1992).
-
(1992)
Rep. Prog. Phys.
, vol.55
, pp. 487
-
-
Shimizu, R.1
Ze-Jun, D.2
-
18
-
-
0030283962
-
-
From data first published in C. R. K. Marrian, F. K. Perkins, D. Park, E. A. Dobisz, M. C. Peckerar, K.-W. Rhee, and R. Bass, J. Vac. Sci. Technol. B 14, 3864 (1996).
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 3864
-
-
Marrian, C.R.K.1
Perkins, F.K.2
Park, D.3
Dobisz, E.A.4
Peckerar, M.C.5
Rhee, K.-W.6
Bass, R.7
-
20
-
-
12444333893
-
-
Lugano Switzerland, 17-19 September
-
Y. Ochiai, M. Ishida, J. Fujita, T. Ogura, J. Momoda, and E. Ohshima, MNE '02, Lugano Switzerland, 17-19 September 2002.
-
(2002)
MNE '02
-
-
Ochiai, Y.1
Ishida, M.2
Fujita, J.3
Ogura, T.4
Momoda, J.5
Ohshima, E.6
-
21
-
-
79956016490
-
-
K. Liu, Ph. Avouris, J. Bucchignano, R. Martel, S. Sun, and J. Michl, Appl. Phys. Lett. 80, 865 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 865
-
-
Liu, K.1
Avouris, Ph.2
Bucchignano, J.3
Martel, R.4
Sun, S.5
Michl, J.6
-
23
-
-
12444332877
-
-
in press
-
Figure courtesy of NJNC and Lucent Technologies, D. Abusch-Magder, D. Tennant, T. Someya, J. Wang, E. Laskowski, A. Dodabalapur, and Z. Bao (in press).
-
Figure Courtesy of NJNC and Lucent Technologies
-
-
Abusch-Magder, D.1
Tennant, D.2
Someya, T.3
Wang, J.4
Laskowski, E.5
Dodabalapur, A.6
Bao, Z.7
-
24
-
-
0006108219
-
-
L. S. Hordon, Z. R. Huang, N. Maluf, R. Browning, and R. F. W. Pease, J. Vac. Sci. Technol. B 11, 2299 (1993).
-
(1993)
J. Vac. Sci. Technol. B
, vol.11
, pp. 2299
-
-
Hordon, L.S.1
Huang, Z.R.2
Maluf, N.3
Browning, R.4
Pease, R.F.W.5
-
27
-
-
21544463817
-
-
E. A. Dobisz and C. R. K. Marrian, Appl. Phys. Lett. 58, 22 (1991); 58, 2526 (1991).
-
(1991)
Appl. Phys. Lett.
, vol.58
, pp. 2526
-
-
-
28
-
-
0006290809
-
-
J. A. Dagata, J. Schneir, H. H. Haray, C. J. Evans, M. T. Postek, and J. Bennett, Appl. Phys. Lett. 56, 2003 (1990).
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 2003
-
-
Dagata, J.A.1
Schneir, J.2
Haray, H.H.3
Evans, C.J.4
Postek, M.T.5
Bennett, J.6
-
38
-
-
0001629322
-
-
F. K. Perkins, E. A. Dobisz, S. L. Brandow, J. M. Calvert, J. E. Kosakowski, and C. R. K. Marrian, Appl. Phys. Lett. 68, 550 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 550
-
-
Perkins, F.K.1
Dobisz, E.A.2
Brandow, S.L.3
Calvert, J.M.4
Kosakowski, J.E.5
Marrian, C.R.K.6
-
40
-
-
79956054356
-
-
Y.-L. Loo, R. L. Willett, K. W. Baldwin, and J. A. Rogers, Appl. Phys. Lett. 81, 562 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 562
-
-
Loo, Y.-L.1
Willett, R.L.2
Baldwin, K.W.3
Rogers, J.A.4
-
42
-
-
5344268855
-
-
J. Haisma, M. Verheijen, and K. van den Heuvel, J. Vac. Sci. Technol. B 14, 4124 (1996); T. Bailey, B. J. Choi, M. Colburn, M. Meissl, S. Shaya, J. G. Ekerdt, S. V. Sreenivasan, and C. G. Wilson, ibid. 18, 3572 (2000).
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 4124
-
-
Haisma, J.1
Verheijen, M.2
Van den Heuvel, K.3
-
43
-
-
0034316495
-
-
J. Haisma, M. Verheijen, and K. van den Heuvel, J. Vac. Sci. Technol. B 14, 4124 (1996); T. Bailey, B. J. Choi, M. Colburn, M. Meissl, S. Shaya, J. G. Ekerdt, S. V. Sreenivasan, and C. G. Wilson, ibid. 18, 3572 (2000).
-
(2000)
J. Vac. Sci. Technol. B
, vol.18
, pp. 3572
-
-
Bailey, T.1
Choi, B.J.2
Colburn, M.3
Meissl, M.4
Shaya, S.5
Ekerdt, J.G.6
Sreenivasan, S.V.7
Wilson, C.G.8
-
44
-
-
0141836181
-
-
D. J. Resnick, W. J. Dauksher, D. Mancini, K. J. Nordquist, T. C. Bailey, S. Johnson, N. Stacey, J. G. Ekerdt, C. G. Willson, S. V. Sreenivasan, and N. Schumaker Microlithography 2003 [Proc. SPIE 5037, 12 (2003)].
-
(2003)
Microlithography 2003
-
-
Resnick, D.J.1
Dauksher, W.J.2
Mancini, D.3
Nordquist, K.J.4
Bailey, T.C.5
Johnson, S.6
Stacey, N.7
Ekerdt, J.G.8
Willson, C.G.9
Sreenivasan, S.V.10
Schumaker, N.11
-
45
-
-
0141836181
-
-
D. J. Resnick, W. J. Dauksher, D. Mancini, K. J. Nordquist, T. C. Bailey, S. Johnson, N. Stacey, J. G. Ekerdt, C. G. Willson, S. V. Sreenivasan, and N. Schumaker Microlithography 2003 [Proc. SPIE 5037, 12 (2003)].
-
(2003)
Proc. SPIE
, vol.5037
, pp. 12
-
-
-
46
-
-
0012752163
-
-
S. Y. Chou, P. R. Krauss, W. Zhang, L. Guo, and L. Zhuang, J. Vac. Sci. Technol. B 15, 2897 (1997).
-
(1997)
J. Vac. Sci. Technol. B
, vol.15
, pp. 2897
-
-
Chou, S.Y.1
Krauss, P.R.2
Zhang, W.3
Guo, L.4
Zhuang, L.5
-
47
-
-
0035519444
-
-
D. S. Macintyre, Y. Chen, D. Lim, and S. Thoms, J. Vac. Sci. Technol. B 19, 2797 (2001).
-
(2001)
J. Vac. Sci. Technol. B
, vol.19
, pp. 2797
-
-
Macintyre, D.S.1
Chen, Y.2
Lim, D.3
Thoms, S.4
-
48
-
-
0347902948
-
-
H.-C. Scheer, H. Schulz, T. Hoffmann, and C. M. Sotomayor Torres, J. Vac. Sci. Technol. B 16, 3917 (1998).
-
(1998)
J. Vac. Sci. Technol. B
, vol.16
, pp. 3917
-
-
Scheer, H.-C.1
Schulz, H.2
Hoffmann, T.3
Sotomayor Torres, C.M.4
-
49
-
-
12444341217
-
-
For example, Nanonex, Trenton, NJ, Obducat, Malmo, Sweden, www.obduoat.com, and EVG, Schaerding, Austria, www.evgroup.com
-
For example, Nanonex, Trenton, NJ www.nanonex.com, Obducat, Malmo, Sweden, www.obduoat.com, and EVG, Schaerding, Austria, www.evgroup.com.
-
-
-
-
51
-
-
0000873669
-
-
M. Okai, S. Tsuji, N. Chinone, and T. Harada, Appl. Phys. Lett. 55, 415 (1989).
-
(1989)
Appl. Phys. Lett.
, vol.55
, pp. 415
-
-
Okai, M.1
Tsuji, S.2
Chinone, N.3
Harada, T.4
-
53
-
-
12444291256
-
-
D. J. Resnick et al., Microlithography 2002 [Proc. SPIE 4688, 4688 (2002)].
-
(2002)
Proc. SPIE
, vol.4688
, pp. 4688
-
-
-
55
-
-
0141724812
-
-
I. McMaekin et al., Microlithography 2003 [Proc. SPIE 5037, 178].
-
Proc. SPIE
, vol.5037
, pp. 178
-
-
-
56
-
-
12444296820
-
-
Austin TX
-
Molecular Imprints, Austin TX www.molecularimprints.com has developed SFIL tooling suited to research and low level manufacturing.
-
-
-
-
57
-
-
0037014680
-
-
Y.-L. Loo, R. L. Willett, K. W. Baldwin, and J. A. Rogers, J. Am. Chem. Soc. 124, 7654 (2002).
-
(2002)
J. Am. Chem. Soc.
, vol.124
, pp. 7654
-
-
Loo, Y.-L.1
Willett, R.L.2
Baldwin, K.W.3
Rogers, J.A.4
-
58
-
-
12444306769
-
-
www.ITRS.org.
-
-
-
-
59
-
-
0035519809
-
-
T. Bailey, B. Smith, B. J. Choi, M. Colburn, M. Meissl, S. V. Sreenivasan, J. G. Ekerdt, and C. G. Willson, J. Vac. Sci. Technol. B 19, 2806 (2001).
-
(2001)
J. Vac. Sci. Technol. B
, vol.19
, pp. 2806
-
-
Bailey, T.1
Smith, B.2
Choi, B.J.3
Colburn, M.4
Meissl, M.5
Sreenivasan, S.V.6
Ekerdt, J.G.7
Willson, C.G.8
-
63
-
-
0001075549
-
-
M. J. Lercel, G. F. Redinbo, F. D. Pardo, M. Rooks, R. C. Tiberio, P. Simpson, H. G. Craighead, C. W. Sheen, A. N. Parikh, and D. L. Allaraet, J. Vac. Sci. Technol. B 12, 3663 (1994).
-
(1994)
J. Vac. Sci. Technol. B
, vol.12
, pp. 3663
-
-
Lercel, M.J.1
Redinbo, G.F.2
Pardo, F.D.3
Rooks, M.4
Tiberio, R.C.5
Simpson, P.6
Craighead, H.G.7
Sheen, C.W.8
Parikh, A.N.9
Allaraet, D.L.10
-
64
-
-
0035519121
-
-
W. Geyer, V. Stadler, W. Eck, A. Golzhauser, M. Grunze, M. Sauer, T. Weimann, and P. Hinze, J. Vac. Sci. Technol. B 19, 2732 (2001).
-
(2001)
J. Vac. Sci. Technol. B
, vol.19
, pp. 2732
-
-
Geyer, W.1
Stadler, V.2
Eck, W.3
Golzhauser, A.4
Grunze, M.5
Sauer, M.6
Weimann, T.7
Hinze, P.8
-
65
-
-
0036883154
-
-
M. E. Andersen, R. K. Smith, Z. J. Donhauser, A. Hatzor, P. A. Lewis, L. P. Tan, H. Tanaka, M. W. Horn, and P. S. Weiss, J. Vac. Sci. Technol. B 20, 2739 (2002).
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, pp. 2739
-
-
Andersen, M.E.1
Smith, R.K.2
Donhauser, Z.J.3
Hatzor, A.4
Lewis, P.A.5
Tan, L.P.6
Tanaka, H.7
Horn, M.W.8
Weiss, P.S.9
-
67
-
-
0036883157
-
-
K. W. Guarini, C. T. Black, H. Zhang, H. Kim, E. M. Sikorski, and I. V. Babich, J. Vac. Sci. Technol. B 20, 2788 (2002).
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, pp. 2788
-
-
Guarini, K.W.1
Black, C.T.2
Zhang, H.3
Kim, H.4
Sikorski, E.M.5
Babich, I.V.6
-
68
-
-
77249085463
-
-
For example, D. A. Foucher, B. Z. Tang, and I. Manners, J. Am. Ceram. Soc. 114, 6246 (1992).
-
(1992)
J. Am. Ceram. Soc.
, vol.114
, pp. 6246
-
-
Foucher, D.A.1
Tang, B.Z.2
Manners, I.3
-
69
-
-
0035800425
-
-
Weinheim, Ger.
-
J. Y. Cheng, C. A. Ross, V. Z.-H. Chan, E. L. Thomas, R. G. H. Lammerertink, and G. L. Vansco, Adv. Mater. (Weinheim, Ger.) 13, 1174 (2001).
-
(2001)
Adv. Mater.
, vol.13
, pp. 1174
-
-
Cheng, J.Y.1
Ross, C.A.2
Chan, V.Z.-H.3
Thomas, E.L.4
Lammerertink, R.G.H.5
Vansco, G.L.6
-
71
-
-
0037418379
-
-
Weinheim, Ger.
-
Y. N. Xia, P. D. Yang, Y. D. Sumn, Y. Y. Wu, B. Mayers, B. Gates, Y. D. Yin, F. Kim, and Y. Q. Yan, Adv. Mater, (Weinheim, Ger.) 15, 353 (2003).
-
(2003)
Adv. Mater
, vol.15
, pp. 353
-
-
Xia, Y.N.1
Yang, P.D.2
Sumn, Y.D.3
Wu, Y.Y.4
Mayers, B.5
Gates, B.6
Yin, Y.D.7
Kim, F.8
Yan, Y.Q.9
-
72
-
-
79956056821
-
-
J. Y. Cheng, C. A. Ross, E. L. Thomas, H. I. Smith, and G. J. Vancso, Appl. Phys. Lett. 81, 3657 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 3657
-
-
Cheng, J.Y.1
Ross, C.A.2
Thomas, E.L.3
Smith, H.I.4
Vancso, G.J.5
-
73
-
-
0000064757
-
-
P. A. Smith, C. D. Nordquist, T. N. Jackson, T. S. Mayer, B. R. Martin, J. Mbindyo, and T. E. Mallouk, Appl. Phys. Lett. 77, 1399 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 1399
-
-
Smith, P.A.1
Nordquist, C.D.2
Jackson, T.N.3
Mayer, T.S.4
Martin, B.R.5
Mbindyo, J.6
Mallouk, T.E.7
-
74
-
-
12444316374
-
-
Langmuir-Blodgett films are similar to SAMs except that the binding between surface and monomer is weaker. Films are usually transferred to a solid substrate after having been formed on a liquid surface from monomers with hydrophobic and hydrophilic end groups
-
Langmuir-Blodgett films are similar to SAMs except that the binding between surface and monomer is weaker. Films are usually transferred to a solid substrate after having been formed on a liquid surface from monomers with hydrophobic and hydrophilic end groups.
-
-
-
-
75
-
-
0034621827
-
-
London
-
S. R. Whaley, D. S. English, E. L. Hu, P. F. Barbara, and A. M. Belcher, Nature (London) 405, 665 (2000).
-
(2000)
Nature
, vol.405
, pp. 665
-
-
Whaley, S.R.1
English, D.S.2
Hu, E.L.3
Barbara, P.F.4
Belcher, A.M.5
-
77
-
-
0036614002
-
-
E. J. Snyder, J. Chideme, and G. S. W. Craig, Jpn. J. Appl. Phys., Part 1 41, 4366 (2002).
-
(2002)
Jpn. J. Appl. Phys. Part 1
, vol.41
, pp. 4366
-
-
Snyder, E.J.1
Chideme, J.2
Craig, G.S.W.3
-
78
-
-
36849140826
-
-
H. A. Pohl, J. Appl. Phys. 22, 869 (1951); Dielectrophoresis (Cambridge University Press, London, 1978).
-
(1951)
J. Appl. Phys.
, vol.22
, pp. 869
-
-
Pohl, H.A.1
-
79
-
-
36849140826
-
-
Cambridge University Press, London
-
H. A. Pohl, J. Appl. Phys. 22, 869 (1951); Dielectrophoresis (Cambridge University Press, London, 1978).
-
(1978)
Dielectrophoresis
-
-
-
80
-
-
0032625830
-
-
Weinheim, Ger.
-
B. R. Martin, D. J. Dermody, B. D. Reiss, M. Fang, L. A. Lyon, M. J. Natan, and T. E. Mallouk, Adv. Mater. (Weinheim, Ger.) 12, 1021 (1999).
-
(1999)
Adv. Mater.
, vol.12
, pp. 1021
-
-
Martin, B.R.1
Dermody, D.J.2
Reiss, B.D.3
Fang, M.4
Lyon, L.A.5
Natan, M.J.6
Mallouk, T.E.7
-
81
-
-
12444302168
-
-
NRC, and U.S. Naval Research Laboratory
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Figure courtesy of J. Novak and E. S. Snow, NRC, and U.S. Naval Research Laboratory.
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-
-
Novak, J.1
Snow, E.S.2
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