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Volumn 7, Issue 12, 2007, Pages 3723-3728

Controllable fabrication and electrical performance of single crystalline Cu2O nanowires with high aspect ratios

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; COPPER OXIDES; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; HYDROTHERMAL SYNTHESIS; NANOWIRES;

EID: 38049140687     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0721259     Document Type: Article
Times cited : (233)

References (31)
  • 7
    • 0029795756 scopus 로고    scopus 로고
    • Snoke, D. Science 1996, 273, 1351.
    • (1996) Science , vol.273 , pp. 1351
    • Snoke, D.1
  • 16
    • 38049122391 scopus 로고    scopus 로고
    • Duan, X.; Huang, Y.; Cui, Y.; Lieber, C. M. Molecular Nanoelectronics; Reed, M. A., Lee, T., Eds.; American Scientific Publishers: Stevenson Ranch, CA, 2003.
    • (a) Duan, X.; Huang, Y.; Cui, Y.; Lieber, C. M. Molecular Nanoelectronics; Reed, M. A., Lee, T., Eds.; American Scientific Publishers: Stevenson Ranch, CA, 2003.
  • 26
    • 38049163247 scopus 로고    scopus 로고
    • -1 are associated with the 2,5-substituted aromatic rings.
    • -1 are associated with the 2,5-substituted aromatic rings.
  • 28
    • 1942421583 scopus 로고    scopus 로고
    • When the work function of the contact metal is larger than that of the semiconductor, an n-type semiconductor exhibits a Schottky barrier while a p-type semiconductor exhibits ohmic contact. The work function (WF) of poly(2,5-dimethoxyaniline) is not larger thanthat of polyaniline (4.5-4.7 eV) due to the donating electron effect of methoxy group. Thus, Schottky barriers existing between the Cu2O/ poly(2,5-dimethoxyaniline) nanowires and the Pt (WF, 5.7 eV) contacts implies that the Cu20/poly(2,5- dimefhoxyaniline) core/sheath nanowires are an n-type semiconductor. Also see: (a) Posdorfer, J. R, Werner, B, Wessling, B, Heun, S, Becker, H. Proc. SPIE-lnt. Soc. Opt. Eng. 2004, 5214, 188
    • 20/poly(2,5- dimefhoxyaniline) core/sheath nanowires are an n-type semiconductor. Also see: (a) Posdorfer, J. R.; Werner, B.; Wessling, B.; Heun, S.; Becker, H. Proc. SPIE-lnt. Soc. Opt. Eng. 2004, 5214, 188.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.