Green, yellow, and orange defect emission from ZnO nanostructures: Influence of excitation wavelength

Applied Physics Letters

Volumn 88, Issue 10, 2006, Pages

  Djurisic A B ^a   Leung, Y H ^a   Tam, K H ^a   Ding, L ^b   Ge, W K ^b   Chen, H Y ^c   Gwo, S ^c  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^c NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTROMAGNETIC WAVE EMISSION; LUMINESCENCE; NANOSTRUCTURED MATERIALS; NEEDLES; PHOTOLUMINESCENCE; TEMPERATURE; VISIBILITY;

DEFECT EMISSION; INTRINSIC DEFECTS; ORANGE-RED DEFECT EMISSION; RODS EXHIBITED YELLOW DEFECT EMISSION; SHELLS EXHIBITED GREEN DEFECT EMISSION; VISIBLE SPECTRAL RANGE; WAVELENGTH DEPENDENCES;

ZINC OXIDE;

EID: 33644882228     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2182096     Document Type: Article

References (24)

1. A. B. Djurišić, W. C. H. Choy, V. A. L. Roy, Y. H. Leung, C. Y. Kwong, K. W. Cheah, T. K. Gundu Rao, W. K. Chan, H. F. Lui, and C. Surya, Adv. Funct. Mater. 14, 856 (2004).
2. W. M. Kwok, Y. H. Leung, A. B. Djurišić, W. K. Chan, and D. L. Phillips, Appl. Phys. Lett. 87, 093108 (2005).
3. D. Li, Y. H. Leung, A. B. Djurišić, Z. T. Liu, M. H. Xie, S. L. Shi, S. J. Xu, and W. K. Chan, Appl. Phys. Lett. 85, 1601 (2004).
4. Y. H. Leung, K. H. Tam, A. B. Djurišić, M. H. Xie, W. K. Chan, Ding Lu, and W. K. Ge, J. Cryst. Growth 283, 134 (2005).
5. S. A. Studenikin, N. Golego, and M. Cocivera, J. Appl. Phys. 84, 2287 (1998).
6. Y. F. Mei, G. G. Siu, R. K. Y. Fu, K. W. Wong, P. K. Chu, C. W. Lai, and H. C. Ong, Nucl. Instrum. Methods Phys. Res. B 237, 307 (2005).
7. L. S. Vlasenko, and G. D. Watkins, Phys. Rev. B 72, 035203 (2005).
8. R. Radoi, P. Fernández, J. Piqueras, M. S. Wiggins, and J. Solis, Nanotechnology 14, 794 (2003).
9. L. Wu, Y. Wu, X. Pan, and F. Kong, Opt. Mater. 28, 418 (2006).
10. A. El Hichou, M. Addou, J. Ebothá, and M. Troyon, J. Lumin. 113, 183 (2005).
11. S. A. M. Lima, F. A. Sigoli, M. Jafelicci, Jr., and M. R. Davolos, Int. J. Inorg. Mater. 3, 749 (2001).
12. H. Priller, M. Decker, R. Hauschild, H. Kalt, and C. Klingshirn, Appl. Phys. Lett. 86, 111909 (2005).
13. R. B. Lauer, J. Phys. Chem. Solids 34, 249 (1973).
14. T. Minami, H. Nanto, and S. Takata, J. Lumin. 24/25, 63 (1981).
15. C. Gaspar, F. Costa, and T. Monteiro, J. Mater. Sci.: Mater. Electron. 12, 269 (2001).
16. N. Ohashi, N. Ebisawa, T. Sekiguchi, I. Sakaguchi, Y. Wada, T. Takenaka, and H. Haneda, Appl. Phys. Lett. 86, 091902 (2005).
17. T. Sekiguchi, S. Miyashita, K. Obara, T. Shishido, and N. Sakagami, J. Cryst. Growth 214/215, 72 (2000).
18. Yu. V. Gorelkinskii and G. D. Watkins, Phys. Rev. B 69, 115212 (2004).
19. L. E. Greene, M. Law, J. Goldberger, F. Kim, J. C. Johnson, Y. Zhang, R. J. Saykally, and P. Yang, Angew. Chem., Int. Ed. 42, 3031 (2003).
20. H. C. Ong, and G. T. Du, J. Cryst. Growth 265, 471 (2004).
21. K. Vanheusden, C. H. Seager, W. L. Warren, D. R. Tallant, and J. A. Voigt, Appl. Phys. Lett. 68, 403 (1996).
22. A. van Dijken, E. A. Meulenkamp, D. Vanmaekelbergh, and A. Meijerink, J. Phys. Chem. B 104, 1715 (2000).
23. L. Dai, X. L. Chen, W. J. Wang, T. Zhou, and B. Q. Hu, J. Phys.: Condens. Matter 15, 2221 (2003).
24. P. S. Xu, Y. M. Sun, C. S. Shi, F. Q. Xu, and H. B. Pan, Nucl. Instrum. Methods Phys. Res. B 199, 286 (2003).