-
1
-
-
0006165687
-
-
R. S. Ruoff and K. M. Kadish, Eds. Electrochemical Society, Pennington, NJ
-
B. I. Yakobson, in Fullerenes - Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, R. S. Ruoff and K. M. Kadish, Eds. (Electrochemical Society, Pennington, NJ, 1997), vol. 5 (97-42), pp. 549-560.
-
(1997)
Fullerenes - Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials
, vol.5
, Issue.42-97
, pp. 549-560
-
-
Yakobson, B.I.1
-
2
-
-
0031219730
-
-
_, M. P. Campbell, C. J. Brabec, J. Bernholc, Comput. Mater. Sci. 8, 341 (1997). The strain rate in this computer simulation was extremely high.
-
(1997)
Comput. Mater. Sci.
, vol.8
, pp. 341
-
-
Campbell, M.P.1
Brabec, C.J.2
Bernholc, J.3
-
10
-
-
4244114379
-
-
_, Phys. Rev. Lett. 81, 4656 (1998).
-
(1998)
Phys. Rev. Lett.
, vol.81
, pp. 4656
-
-
-
11
-
-
0033525774
-
-
P. Poncharal, Z. L. Wang, D. Ugarte, W. A. de Heer, Science 283, 1513 (1999).
-
(1999)
Science
, vol.283
, pp. 1513
-
-
Poncharal, P.1
Wang, Z.L.2
Ugarte, D.3
De Heer, W.A.4
-
12
-
-
0001291569
-
-
A. Krishnan, E. Dujardin, T. W. Ebbesen, P. N. Yianilos, M. M. J. Treacy, Phys. Rev. B Condens. Matter Mater. Phys. 58, 14031 (1998).
-
(1998)
Phys. Rev. B Condens. Matter Mater. Phys.
, vol.58
, pp. 14031
-
-
Krishnan, A.1
Dujardin, E.2
Ebbesen, T.W.3
Yianilos, P.N.4
Treacy, M.M.J.5
-
18
-
-
21544452288
-
-
H. D. Wagner, O. Lourie, Y. Feldman, R. Tenne, Appl. Phys. Lett. 72, 188 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 188
-
-
Wagner, H.D.1
Lourie, O.2
Feldman, Y.3
Tenne, R.4
-
21
-
-
2142803437
-
-
Experimental details are available at Science Online at www.sciencemag.org/Feature/data/1046083.shl.
-
Science Online
-
-
-
22
-
-
0342438805
-
-
note
-
-1, according to the recorded video tape.
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-
-
-
23
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0343308473
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note
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There are three soft cantilevers in series on the same side of the AFM probe. The nominal lengths l of these three separate silicon spring-beam type cantilevers (the cs12 contact mode AFM probe was supplied by NT-MDT) are 350, 300, and 250 μm; all have a nominal width, w, of 35 μm and a nominal thickness, t, of 1 μm. The force constant (K) of each can be calculated with the formula K = Ewt3/4L3. (Here E is for a silicon single crystal, 145 GPa.) We measured L, w, and t in an SEM and used the measured, not the nominal, values to calculate K.
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0342438804
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note
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-2) and the OD of this MWCNT (33 nm), the capillary force between MWCNT layers, which is equal to 2πODγ, is calculated to be ∼50 nN; also, with use of the shear strength of graphite (∼0.48 MPa) and the initial contact length between MWCNT layers (∼10 mm), the shear force needed for sliding between nested layers would be ∼50 nN. Because each of these values exceeds the measured upper limit force, further study of the energetics and forces involved in pullout is needed.
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30
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0003495042
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-
Springer-Verlag, New York
-
M. S. Dresselhaus, G. Dresselhaus, K. Sugihara, I. L. Spain, H. A. Goldberg, Graphite Fibers and Filaments, Springer Series in Materials Science (Springer-Verlag, New York, 1988), vol. 5.
-
(1988)
Graphite Fibers and Filaments, Springer Series in Materials Science
, vol.5
-
-
Dresselhaus, M.S.1
Dresselhaus, G.2
Sugihara, K.3
Spain, I.L.4
Goldberg, H.A.5
-
32
-
-
0027909801
-
-
R. S. Ruoff, J. Tersoff, D. C. Lorents, S. Subramoney, B. Chan, Nature 364, 514 (1993).
-
(1993)
Nature
, vol.364
, pp. 514
-
-
Ruoff, R.S.1
Tersoff, J.2
Lorents, D.C.3
Subramoney, S.4
Chan, B.5
-
33
-
-
0000399725
-
-
N. G. Chopra et al., Nature 377, 135 (1995).
-
(1995)
Nature
, vol.377
, pp. 135
-
-
Chopra, N.G.1
-
34
-
-
0342873376
-
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note
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This work was partially supported by the Office of Naval Research and the Defense Advanced Research Projects Agency under Navy grant N000014-99-1-0769, by NSF under the New Tools and Methods for Nanotechnology grant NSF-DMR 9871874, and by Zyvex. We thank R. E. Smalley's group at Rice University for the MWCNT samples and the staff at the Materials Science Center at the University of Wisconsin (UW) for their assistance (the NSF Materials Research Science and Engineering at UW provides support for the UW electron microscope facilities). We appreciate use of the Washington University TEM facility overseen by P. Gibbons; and we thank B. Files, T. Kowalewski, B. Yakobson, and R. Carpick for commenting on the manuscript. R.S.R. would like to dedicate this paper to the memory of Herbert S. Gutowsky.
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