Microscale characterization of mechanical properties

Annual Review of Materials Research

Volumn 37, Issue , 2007, Pages 92-126

  Hemker, K J ^a   Sharpe Jr , W N ^a  

^a Johns Hopkins University

Author keywords

Experimental techniques; High temperature; Microelectromechanical systems (MEMS); Microtensile testing; Size effects; Strength; Young's modulus

Indexed keywords

CRYSTALLOGRAPHY; DISLOCATIONS (CRYSTALS); DUCTILITY; MATERIALS HANDLING; MEMS; STRENGTH OF MATERIALS;

EXPERIMENTAL TECHNIQUES; MICRON-SIZED STRUCTURES; MICROTENSILE TESTING; SIZE EFFECTS;

MICROSTRUCTURE;

EID: 34848812263     PISSN: 15317331     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev.matsci.36.062705.134551     Document Type: Review

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