Stress-assisted discontinuous grain growth and its effect on the deformation behavior of nanocrystalline aluminum thin films

Acta Materialia

Volumn 54, Issue 8, 2006, Pages 2253-2263

  Gianola, D S ^a   Van Petegem, S ^b   Legros, M ^c   Brandstetter, S ^b   Van Swygenhoven, H ^b   Hemker, K J ^a  

^a Johns Hopkins University   (United States)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c CEMES CNRS   (France)

Author keywords

Grain boundary migration; Mechanical properties; Nanocrystalline materials; Plastic deformation; Thin films

Indexed keywords

ALUMINUM; GRAIN BOUNDARIES; GRAIN GROWTH; MECHANICAL PROPERTIES; NANOSTRUCTURED MATERIALS; PLASTIC DEFORMATION; TRANSMISSION ELECTRON MICROSCOPY;

DISCONTINUOUS GRAIN GROWTH; GRAIN BOUNDARY MIGRATION; NANOCRYSTALLINE FILMS; NANOSCALE DEFORMATION;

THIN FILMS;

EID: 33645961888     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.01.023     Document Type: Article

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