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Volumn 103, Issue 1-2, 2003, Pages 59-63

Measured mechanical properties of LIGA Ni structures

Author keywords

Fatigue; LIGA Ni; Mechanical properties; MEMS

Indexed keywords

CREEP; ELECTROPLATING; FATIGUE OF MATERIALS; LITHOGRAPHY; MICROSTRUCTURE; MOLDING; NICKEL; TENSILE STRENGTH; YIELD STRESS;

EID: 0037439063     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(02)00314-X     Document Type: Conference Paper
Times cited : (138)

References (11)
  • 1
    • 0000518739 scopus 로고    scopus 로고
    • LIGA technologies and applications
    • J. Hruby, LIGA technologies and applications, MRS Bull. 26 (4) (2001) 337-340.
    • (2001) MRS Bull. , vol.26 , Issue.4 , pp. 337-340
    • Hruby, J.1
  • 3
    • 17144460188 scopus 로고    scopus 로고
    • Annealing effects on the microstructure and mechanical properties of LIGA nickel for MEMS
    • PPEES 23
    • H.S. Cho, W.G. Babcock, H. Last, K.J. Hemker, Annealing effects on the microstructure and mechanical properties of LIGA nickel for MEMS, MRS Symposium Proc. Vol. 657 (2001) PPEES 23, pp. 1-6.
    • (2001) MRS Symposium Proc. , vol.657 , pp. 1-6
    • Cho, H.S.1    Babcock, W.G.2    Last, H.3    Hemker, K.J.4
  • 4
    • 0033324043 scopus 로고    scopus 로고
    • Understanding and tailoring the mechanical properties of LIGA fabricated materials
    • T.E. Buchheit, T.R. Christenson, D.T. Schmale, D.A. Lavan, Understanding and tailoring the mechanical properties of LIGA fabricated materials, MRS Symp. Proc. 546 (1999) 121-126.
    • (1999) MRS Symp. Proc. , vol.546 , pp. 121-126
    • Buchheit, T.E.1    Christenson, T.R.2    Schmale, D.T.3    Lavan, D.A.4
  • 5
    • 0035703367 scopus 로고    scopus 로고
    • Microsample tensile testing of LIGA nickel for MEMS applications
    • K.J. Hemker, H.R. Last, Microsample tensile testing of LIGA nickel for MEMS applications, Mater. Sci. Eng. A 319-321 (2001) 882-886.
    • (2001) Mater. Sci. Eng. A , vol.319-321 , pp. 882-886
    • Hemker, K.J.1    Last, H.R.2
  • 7
    • 0035449665 scopus 로고    scopus 로고
    • Development of high temperature microsample testing
    • M. Zupan, M.J. Hayden, C.J. Boehlert, K.J. Hemker, Development of high temperature microsample testing, Exp. Mech. 41 (2001) 242-247.
    • (2001) Exp. Mech. , vol.41 , pp. 242-247
    • Zupan, M.1    Hayden, M.J.2    Boehlert, C.J.3    Hemker, K.J.4
  • 8
    • 0027811859 scopus 로고
    • Effect of porosity on Young's modulus of nanocrystalline materials
    • V. Krstic, U. Erb, G. Palumbo, Effect of porosity on Young's modulus of nanocrystalline materials, Scripta Metall. Mater. 29 (1993) 1501-1504.
    • (1993) Scripta Metall. Mater. , vol.29 , pp. 1501-1504
    • Krstic, V.1    Erb, U.2    Palumbo, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.