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Volumn 86, Issue 33-35 SPEC. ISSUE, 2006, Pages 5567-5579
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Size effects in the deformation of sub-micron Au columns
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPRESSION TESTING;
DEFORMATION;
GOLD;
INDENTATION;
SHEAR STRESS;
COMPRESSED COLUMNS;
COMPRESSIVE YIELD STRESS;
FOCUSED ION BEAM MICROSCOPES;
UNIAXIAL COMPRESSION TESTS;
SINGLE CRYSTALS;
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EID: 33748780901
PISSN: 14786435
EISSN: 14786443
Source Type: Journal
DOI: 10.1080/14786430600567739 Document Type: Conference Paper |
Times cited : (664)
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References (25)
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