Tensile behavior of free-standing gold films. Part I. Coarse-grained films

Acta Materialia

Volumn 51, Issue 7, 2003, Pages 2067-2078

  Emery, R D ^a,b   Povirk, G L ^a,c  

^a Yale University   (United States)

^b INTEL CORPORATION   (United States)

^c Knolls Atomic Power Laboratory   (United States)

Author keywords

Annealing; Grain boundary strengthening; Hall Petch; Tensile testing; Thin films

Indexed keywords

ANNEALING; DUCTILITY; GOLD; GRAIN BOUNDARIES; MICROSTRUCTURE; TENSILE TESTING;

GRAIN BOUNDARY STRENGTHENING;

METALLIC FILMS;

EID: 0037453320     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(03)00006-5     Document Type: Article

References (41)

1. Nix W.D. Metal Trans A. 20A:1989;2217.
2. Alexopoulos P.S., O'Sullivan T.C. Annu Rev Mater Sci. 20:1990;391.
3. Venkatraman R., Bravman J.C. J Mater Res. 7:(8):1992;2040.
4. Kirchner S., Kraft O., Baker S.P., Arzt E. MRS Symp Proc. 436:1997;21.
5. Brückner W., Macionczyk F., Reiss G. MRS Symp Proc. 436:1997;47.
6. Kang Y.S., Ho P.S., Knipe R., Tregilgas J. MRS Symp Proc. 436:1997;35.
7. Kretschmann A., Kuschke W.M., Baker S.P., Arzt E. MRS Symp Proc. 436:1997;59.
8. Hommel M., Kraft O., Arzt E. J Materials Res. 14:(6):1999;2373.
9. Beams J.W. Structure and properties of thin films. 1959;183 Wiley and Sons, New York.
10. Catlin A., Walker W.P. JAP. 31:(12):1960;2135.
11. Paviot V.M., Vlassak J.J., Nix W.D. MRS Symp Proc. 356:1995;579.
12. Weihs T.P., Hong S., Bravman J.C., Nix W.D. J Mater Res. 3:(5):1988;931.
13. Menter J.W., Pashley D.W. Structure and properties of thin films. 1959;111 Wiley and Sons, New York.
14. Marsh D.M. J Sci Inst. 36:1959;165.
15. Neugebauer C.A. J Appl Phys. 31:1960;1096.
16. Henning C.A.O., Boswell F.W., Corbett J.M. Acta Met. 23:1975;177.
17. Mearini G.T., Hoffman R.W. J of Electronic Materials. 22:(6):1993;623.
18. Read D.T., Dally J.W. Int J of Microcircuits Elec Pack. 16:(4):1993;313.
19. Ruud J.A., Josell D., Spaepen F., Greer A.L. J Mater Res. 8:1993;112.
20. Greek S., Ericson F., Johansson S., Schweitz J-Å. MRS Symp Proc. 436:1997;227.
21. Emery R.D., Lenshek D.X., Behin B., Gherasimova M., Povirk G.L. MRS Symp Proc. 472:1997;361.
22. Huang H., Spaepen F. Acta Materialia. 48:(12):2000;3261.
23. Read D.T., Cheng Y-W., Keller R.R., McColskey J.D. Scripta Materialia. 45:2001;583.
24. Emery RD, Povirk GL. Tensile behavior of free-standing gold films. Part II. Fine-grained films, this issue.
25. Scion Image is a PC version of the Macintosh program NIH Image, written by the National Institute of Health. It is available free of charge at www.scioncorp.com/index.htm.
26. Greiser J., Millner P., Arzt E. Materials Science Forum. 273:1998;237.
27. Burleigh IW-710 Inchworm Motor, Burleigh Instruments, Inc., Fishers, NY.
28. GS-30 (-500) load cell, Transducer Techniques, Inc., Temecula, CA.
29. HL Image++98 is a commercial image analysis software package.
30. Lapman S. ASM Handbook, Vol. 2. 1990;ASM International.
31. Josell D., van Heerden D., Read D., Bonevich J., Schectman D. J Mater Res. 13:(10):1998;2902.
32. Josell D., Spaepen F. Acta Metall Mater. 41:(10):1993;3007.
33. McKeown J., Hudson O.F. Journal Inst Metals. 60:1937;109.
34. Hall E.O. Proc Phys Soc B. 64:1951;747.
35. Petch N.J. JISI. 173:1953;25.
36. Mullins W.W. Acta Met. 6:1958;414.
37. Thompson C.V. Ann Rev Mater Sci. 20:1990;245.
38. Winterbottom W.L., Gjostein N.A. Acta Metall. 14:1966;1041.
39. Kocks U.F., Argon A.S., Ashby M.F. Prog Mat Sci. 19:1975.
40. Emery RD. Ph.D. Thesis, Yale University, 2001.
41. Frost H.J., Ashby M.F. Deformation mechanism maps. 1982;Pergamon Press, New York.