High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements

IEEE Transactions on Electron Devices

Volumn 48, Issue 12, 2001, Pages 2830-2835

  Stellari, Franco ^a,b   Zappa, Franco ^a,b   Cova, Sergio ^a,b   Porta, Cristian ^b   Tsang, James C ^a,c  

^a IEEE   (Italy)

^b CNR   (Italy)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Circuit testing; Jitter; Luminescence; Picosecond imaging for circuit analysis (PICA); Ring oscillator; Single photon avalanche diode (SPAD); Time correlated photon counting; ULSI

Indexed keywords

SINGLE-PHOTON AVALANCHE-DIODES (SPAD);

AVALANCHE DIODES; ELECTRON BEAMS; JITTER; LUMINESCENCE; MOSFET DEVICES; OSCILLATORS (ELECTRONIC); ULSI CIRCUITS;

CMOS INTEGRATED CIRCUITS;

EID: 0035691586     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.974711     Document Type: Article

References (21)

1. An integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
2. Optical probing of flip-chip-packaged microprocessors
3. Waveform acquisition from the backside of silicon using electro-optic probing
4. Practical optical probing of flip-chip CMOS devices
5. Hot luminescence from CMOS circuits: A picosecond probe of internal timing
6. Dynamic internal testing of CMOS circuits using hot luminescence
7. Noninvasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence
8. Backside infrared probing for static voltage drop and dynamic timing measurements
9. Photon emission from hot electron in silicon
10. Diagnosis and characterization of timing-related defects by time-dependent light emission
11. Hot-electron-induced photon and photocarrier generation in silicon MOSFETs
12. Double epitaxy improves single-photon avalanche diode performance
13. Noninvasive optical characterization technique for fast switching CMOS circuits
14. New silicon epitaxial avalanche diode for single-photon timing at room temperature
15. Avalanche photodiodes and quenching circuits for single-photon detection
16. Picosecond hot electron light emission from submicron complementary metal-oxide-semiconductor circuits
17. Experimental verification of the link between timing jitter and phase noise