Tools for non-invasive optical characterization of CMOS circuits

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1999, Pages 487-490

  Stellari, F ^a   Zappa, F ^a   Cova, S ^a   Vendrame, L ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON EMISSION; HOT CARRIERS; LUMINESCENCE; MOSFET DEVICES; OPTICAL INSTRUMENTS; PHOTONS; ULSI CIRCUITS;

OPTICAL CHARACTERIZATION; SOFTWARE PACKAGE SPICE;

CMOS INTEGRATED CIRCUITS;

EID: 0033347827     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)