Analog circuit failure analysis using time-resolved emission

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2005, Issue , 2005, Pages 363-369

  Cain, B ^a   Woods, G L ^a   Herlein, R ^a   Syed, A ^a   Nomura, Toshihoro ^a  

^a Credence Systems Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL LOGIC CIRCUIT; TIME-RESOLVED EMISSION (TRE); TRE WAVEFORMS;

BANDWIDTH; FAILURE ANALYSIS; INTEGRATED CIRCUITS; LOGIC CIRCUITS; TIME DOMAIN ANALYSIS;

NETWORKS (CIRCUITS);

EID: 33645683363     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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3. J. A. Kash and J. C. Tsang, "Hot Luminescence from CMOS Circuits: A Picosecond Probe of Internal Timing," Phys. Stat. Sol. (b), vol. 204, pp. 507-516, 1997.
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5. D. Knebel, P. Sanda, M. McManus, et al., "Diagnosis and characterization of timing-related defects by time-dependent light emission," presented at Test Conference, 1998. Proceedings. International, 1998, pp. 733-739.
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7. F. Stellari, F. Zappa, S. Cova, et al., "Tools for non-invasive optical characterization of CMOS circuits," presented at Electron Devices Meeting, 1999. IEDM Technical Digest. International, 1999, pp. 487-490.
8. A. Tosi, F. Stellari, F. Zappa, et al., "Hot-carrier luminescence: comparison of different CMOS technologies," presented at European Solid-State Device Research, 2003. ESSDERC'03. 33rd Conference on, 2003, pp. 351-354.
9. F. Stellari, A. Tosi, F. Zappa, et al., "CMOS Circuit Testing via Time-Resolved Luminescence Measurements and Simulations," IEEE Transactions on Instrumentation and Measurement, vol. 53, pp. 163-169, 2004.
10. M. Gurfinkel, M. Borenshtein, A. Margulis, et al., "Study of Hot-Carrier-Induced Photon Emission from 90 nm Si MOSFETs," Applied Surface Science, vol. 248, pp. 62-65, 2005.