CMOS circuit analysis with luminescence measurements and simulations

European Solid-State Device Research Conference

Volumn , Issue , 2002, Pages 495-498

  Stellari, F ^a   Tosi, A ^b   Zappa, F ^b   Cova, S ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; JITTER;

CIRCUIT BEHAVIORS; CMOS CIRCUITS; DESIGN ERRORS; HIGH SENSITIVITY; LUMINESCENCE MEASUREMENTS; NEAR-INFRARED EMISSIONS; SWITCHING TRANSITIONS; TIME-RESOLUTION;

LUMINESCENCE;

EID: 0042467378     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2002.194976     Document Type: Conference Paper

References (8)

1. R.R. Schaller, "Moore's law: past, present and future", IEEESpectrum, vol. 34, 1997, pp. 52-59.
2. Y. Taur and T.H. Ning, "Fundamentals of modern VLSI devices", Cambridge UniversityPress, 1998.
3. J.C. Tsang, J.A. Kash and D.P. Vallett, "Time-resolved optical characterization of electrical activity in integrated circuits", IEEE Proceedings, vol. 88, 2000, pp. 1440-1459.
4. T.M. Eiles et al, "Optical interferometric probing of advanced microprocessors ", Proc. ITC, 2001, pp. 80-84.
5. F. Stellari, F. Zappa, S. Cova, C. Porta and J.C. Tsang, "High-Speed CMOS Circuit Testing by 50ps Time-Resolved Luminescence Measurements", IEEE Trans, on Electron Dev., vol. 48, 2001, pp. 2830-2835.
6. F. Stellari, F. Zappa, S. Cova and L. Vendrame, "Tools for Non-Invasive Optical Characterization of CMOS Circuits", IEDMTech. Dig, 1999, pp. 487-490.
7. "C4880-21 user manual", Hamamatsu Photonics K.K., Japan.
8. S. Cova, M. Ghioni, A.L. Lacaita, C. Samori and F. Zappa, "Avalanche photodiodes and quenching circuits for single-photon detection", Appl. Opt, vol. 35, 1996, pp. 1956-1963.