Backside flip-chip testing by means of high-bandwidth luminescence detection

Microelectronics Reliability

Volumn 43, Issue 9-11, 2003, Pages 1669-1674

  Tosi, A ^a   Stellari, F ^b   Zappa, F ^a   Cova, S ^a  

^a POLITECNICO DI MILANO   (Italy)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DETECTOR CIRCUITS; LUMINESCENCE; MOS DEVICES; OPTICAL TESTING; OSCILLATORS (ELECTRONIC); PHOTONS;

HOT-CARRIER LUMINESCENCE;

FLIP CHIP DEVICES;

EID: 0041692510     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00302-0     Document Type: Conference Paper

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