CMOS circuit testing via time-resolved luminescence measurements and simulations

IEEE Transactions on Instrumentation and Measurement

Volumn 53, Issue 1, 2004, Pages 163-169

  Stellari, Franco ^a   Tosi, Alberto ^a   Zappa, Franco ^a   Cova, Sergio ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

Circuit testing; Luminescence; Picosecond imaging circuit analysis (PICA); Single photon avalanche diode (SPAD); Time correlated photon counting; Time jitter; VLSI circuits

Indexed keywords

AVALANCHE DIODES; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC FIELDS; LUMINESCENCE; MOSFET DEVICES; OPTICAL VARIABLES MEASUREMENT; PHOTONS; VLSI CIRCUITS;

OPTICAL WAVEFORM; PICOSECOND IMAGING CIRCUIT ANALYSIS; SINGLE PHOTON AVALANCHE DIODE; TIME RESOLVED LUMINESCENCE MEASUREMENT;

INTEGRATED CIRCUIT TESTING;

EID: 0742268996     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.822195     Document Type: Article

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