Experimentalstudies of single-event gate rupture and burnout in vertical power MOSFET's

IEEE Transactions on Nuclear Science

Volumn 43, Issue 2 PART 1, 1996, Pages 533-545

  Titus, Jeffrey L ^a   Wheatley, C Frank ^b  

^a NAVAL SURFACE WARFARE CENTER   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; ELECTRIC CURRENTS; FAILURE ANALYSIS; GATES (TRANSISTOR); MOSFET DEVICES;

DOUBLE DIFFUSED MOSFET DEVICES; SINGLE EVENT BURNOUT; SINGLE EVENT GATE RUPTURE; VERTICAL POWER DEVICES;

RADIATION EFFECTS;

EID: 0030127778     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.490899     Document Type: Article

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