-
1
-
-
0022921353
-
Burnout of Power MOS Transistors with Heavy Ions of 252-Cf
-
A.E. Waskiewicz, J.W. Groninger, V.H. Strahan, and D.M. Long, “Burnout of Power MOS Transistors with Heavy Ions of 252-Cf,” IEEE Trans. Nucl. Sci., NS-33, pp. 1710–1713, 1986.
-
(1986)
IEEE Trans. Nucl. Sci.
, vol.NS-33
, pp. 1710-1713
-
-
Waskiewicz, A.E.1
Groninger, J.W.2
Strahan, V.H.3
Long, D.M.4
-
2
-
-
77957225545
-
Analytical Model for Single Event Burnout of Power MOSFETs
-
J.H. Hohl and K.F. Galloway, “Analytical Model for Single Event Burnout of Power MOSFETs,” IEEE Trans. Nuc. Sci., NS-34, pp. 1275–1280, 1987.
-
(1987)
IEEE Trans. Nuc. Sci.
, vol.NS-34
, pp. 1275-1280
-
-
Hohl, J.H.1
Galloway, K.F.2
-
3
-
-
77957221316
-
First Nondestructive Measurements of Power MOSFET Single Event Burnout Cross Sections
-
D.L. Oberg and J.L. Wert, “First Nondestructive Measurements of Power MOSFET Single Event Burnout Cross Sections,” IEEE Trans. Nucl. Sci., NS-34, pp. 1736–1741, 1987.
-
(1987)
NS-34
, pp. 1736-1741
-
-
Oberg, D.L.1
Wert, J.L.2
-
4
-
-
0024942841
-
Development of Cosmic Ray Hardened Power MOSFETs
-
J.L. Titus, L.S. Jamiolkowski, and C.F. Wheatley, “Development of Cosmic Ray Hardened Power MOSFETs,” IEEE Trans. Nuc. Sci., NS-36, pp. 2375–2382, 1989.
-
(1989)
IEEE Trans. Nuc. Sci.
, vol.NS-36
, pp. 2375-2382
-
-
Titus, J.L.1
Jamiolkowski, L.S.2
Wheatley, C.F.3
-
5
-
-
84941868515
-
SEU-Hard Power MOSFETs
-
T.A. Fischer, “SEU-Hard Power MOSFETs,” in 1987 GOMAC DIGEST, 1987, pp. 131–134.
-
(1987)
1987 GOMAC DIGEST
, pp. 131-134
-
-
Fischer, T.A.1
-
6
-
-
0019279476
-
High Dose Rate Burnout in Silicon Epitaxial Transistors
-
T.F. Wrobel and J.L. Azarewicz, “High Dose Rate Burnout in Silicon Epitaxial Transistors,” IEEE Trans. Nuc. Sci., NS-27, pp. 1411–1415, 1980.
-
(1980)
IEEE Trans. Nuc. Sci.
, vol.NS-27
, pp. 1411-1415
-
-
Wrobel, T.F.1
Azarewicz, J.L.2
-
7
-
-
0004286686
-
-
New York: John Wiley & Sons
-
B.J. Baliga, Modern Power Devices. New York: John Wiley & Sons, pp. 62–129, 1987.
-
(1987)
Modern Power Devices
, pp. 62-129
-
-
Baliga, B.J.1
-
8
-
-
0009717662
-
-
Reading Mass: Addison-Wesley Publishing Company
-
G.W. Neudeck, The Bipolar Junction Transistor. Reading Mass: Addison-Wesley Publishing Company, p. 25, 1983.
-
(1983)
The Bipolar Junction Transistor
, pp. 25
-
-
Neudeck, G.W.1
-
10
-
-
44449105697
-
Features of a Heavy-Ion-Generated-Current Filament Used in Modeling Single-Event Burnout of Power MOSFETs
-
M. S. Thesis, University of Arizona
-
G.H. Johnson, “Features of a Heavy-Ion-Generated-Current Filament Used in Modeling Single-Event Burnout of Power MOSFETs,” M. S. Thesis, University of Arizona, 1990.
-
(1990)
-
-
Johnson, G.H.1
-
11
-
-
0024946276
-
Features of the Triggering Mechanism for Single Event Burnout of Power MOSFETs
-
J.H. Hohl and G.H. Johnson, “Features of the Triggering Mechanism for Single Event Burnout of Power MOSFETs,” IEEE Trans. Nuc. Sci., NS-36, pp. 2260–2266, 1989.
-
(1989)
IEEE Trans. Nuc. Sci.
, vol.NS-36
, pp. 2260-2266
-
-
Hohl, J.H.1
Johnson, G.H.2
-
13
-
-
0006658834
-
Measurement of the Number of Impurities in the Base Layer of a Transistor
-
H.K. Gummel, “Measurement of the Number of Impurities in the Base Layer of a Transistor,” Proc. of the IRE, vol 49, p 834, 1961.
-
(1961)
Proc. of the IRE
, vol.49
, pp. 834
-
-
Gummel, H.K.1
|